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參數(shù)資料
| 型號(hào)： | TS8388BMFS9QC1ZB9 |
| 廠商： | ATMEL CORP |
| 元件分類： | ADC |
| 英文描述： | 1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CQFP68 |
| 封裝： | CERAMIC, QFP-68 |
| 文件頁數(shù)： | 2/43頁 |
| 文件大小： | 825K |
| 代理商： | TS8388BMFS9QC1ZB9 |
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TS8388BFS
10
/42
Preliminary Beta Site
3.5.
EXPLANATION OF TEST LEVELS
D
100 % wafer tested at +25
°C (1)
I
100% production tested at +25
°C (1) (for packaged device).
II
100 % production tested at +25
°C (1), and sample tested at specified temperatures
III
Sample tested only at specified temperatures
IV
Parameter is guaranteed by design and characterization testing (thermal steady-state conditions at
specified temperature).
V
Parameter is a typical value only
VI
100 % production tested over specified temperature range.
Only MIN and MAX values are guaranteed (typical values are issuing from characterization results).
(1) Unless otherwise specified, all tests are pulsed tests : therefore Tj = Tc = Ta,
where Tj ,Tc and Ta are junction, case and ambient temperature respectively.
3.6.
WAFER SCREENING
Parameter
Temperature
JTS8388B chip
Unit
Min
Max
DC Accuracy @ 50 MSPS / 10 MHz
25
°C (2)
DNL
0.6
LSB
INL
0.8
LSB
No missing codes
Guaranteed
AC Performance
50MSPS / 25MHz
25
°C (2)
SNR
45
dB
ENOB
7.1
bit
(2) Unless otherwise specified, all tests are pulsed tests : therefore Tj = Tc = Ta,
where Tj ,Tc and Ta are junction, case and ambient temperature respectively.
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