參數(shù)資料
型號(hào): TS87C58X2-LIE
廠商: Atmel
文件頁(yè)數(shù): 40/62頁(yè)
文件大?。?/td> 0K
描述: IC MCU 8BIT 32K OTP 30MHZ 44VQFP
標(biāo)準(zhǔn)包裝: 160
系列: 87C
核心處理器: 8051
芯體尺寸: 8-位
速度: 30/20MHz
連通性: UART/USART
外圍設(shè)備: POR,WDT
輸入/輸出數(shù): 32
程序存儲(chǔ)器容量: 32KB(32K x 8)
程序存儲(chǔ)器類(lèi)型: OTP
RAM 容量: 256 x 8
電壓 - 電源 (Vcc/Vdd): 2.7 V ~ 5.5 V
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 85°C
封裝/外殼: 44-QFP
包裝: 托盤(pán)
45
4431E–8051–04/06
AT/TS8xC54/8X2
5.
Typicals are based on a limited number of samples and are not guaranteed. The values listed are at room temper-
ature and 5V.
6.
Under steady state (non-transient) conditions, I
OL must be externally limited as follows:
Maximum I
OL per port pin: 10 mA
Maximum I
OL per 8-bit port:
Port 0: 26 mA
Ports 1, 2 and 3: 15 mA
Maximum total I
OL for all output pins: 71 mA
If I
OL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current
greater than the listed test conditions.
7.
For other values, please contact your sales office.
8.
Operating I
CC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns (see Figure
19-5.), V
IL = VSS + 0.5 V,
V
IH = VCC - 0.5V; XTAL2 N.C.; EA = Port 0 = VCC; RST = VSS. The internal ROM runs the code 80 FE (label: SJMP
label). I
CC would be slightly higher if a crystal oscillator is used. Measurements are made with OTP products when
possible, which is the worst case.
Figure 19-1. ICC Test Condition, under reset
Figure 19-2. Operating I
CC Test Condition
EA
VCC
ICC
(NC)
CL O C K
SIGNAL
VCC
All other pins are disconnected.
RST
XTAL2
XTAL1
VSS
VCC
P0
EA
V
CC
V
CC
I
CC
(NC)
CL O C K
SIGNAL
All other pins are disconnected.
RST
XTAL2
XTAL1
VSS
VCC
P0
Reset = Vss after a high pulse
during at least 24 clock cycles
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