參數(shù)資料
型號: VC16241ADGG
廠商: NXP SEMICONDUCTORS
元件分類: 通用總線功能
英文描述: 16-bit buffer/line driver 3-State
中文描述: LVC/LCX/Z SERIES, QUAD 4-BIT DRIVER, TRUE OUTPUT, PDSO48
封裝: 6.10 MM, PLASTIC, SOT-362-1, TSSOP2-48
文件頁數(shù): 4/10頁
文件大小: 78K
代理商: VC16241ADGG
Philips Semiconductors
Product specification
74LVC16241A
16-bit buffer/line driver (3-State)
1997 Jul 29
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
MIN.
MAX.
V
CC
DC supply voltage (for max. speed
performance)
DC supply voltage (for low-voltage
applications)
DC Input voltage range
DC output voltage range; output HIGH or
LOW state
DC output voltage range; output 3-State
Operating ambient temperature range in
free air
2.7
3.6
V
V
CC
1.2
3.6
V
V
I
0
5.5
V
V
O
0
V
CC
V
V
O
0
5.5
V
T
amb
See DC and AC characteristics
for individual device
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
–40
+85
°
C
t
r
, t
f
Input rise and fall times
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS
1
In accordance with the Absolute Maximum Rating System (IEC 134) Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
MIN
–0.5
–0.5
MAX
+6.5
–50
+6.5
50
V
CC
I
IK
V
I
I
OK
DC supply voltage
DC input diode current
DC input voltage
DC output diode current
DC output voltage; output HIGH or LOW
state
DC output voltage; output 3-State
DC output source or sink current
DC V
CC
or GND current
Storage temperature range
Power dissipation per package
– SO package
– SSOP and TSSOP package
V
V
I
< 0
Note 2
mA
V
mA
V
O
> V
CC
or V
O
< 0
V
O
Note 2
–0.5
V
CC
+ 0.5
V
V
O
I
O
Note 2
–0.5
–65
6.5
50
100
+150
V
V
O
= 0 to V
CC
mA
mA
°
C
I
GND
, I
CC
T
stg
P
tot
Above +70
°
C derate linearly 8mW/K
Above +60
°
C derate linearly 5.5mW/K
500
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output clamp current ratings are observed.
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