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參數(shù)資料
| 型號(hào)： | W78M32V70BC |
| 廠商： | WHITE ELECTRONIC DESIGNS CORP |
| 元件分類： | PROM |
| 英文描述： | 8M X 32 FLASH 3.3V PROM, 70 ns, PBGA159 |
| 封裝： | 13 X 22 MM, 1.27 MM PITCH, PLASTIC, BGA-159 |
| 文件頁(yè)數(shù)： | 37/54頁(yè) |
| 文件大?。?/td> | 789K |
| 代理商： | W78M32V70BC |
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White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
White Electronic Designs
W78M32V-XBX
April 2006
Rev. 3
White Electronic Designs Corp. reserves the right to change products or specications without notice.
Current Source
I
OL
I
OH
D.U.T.
C
= 50 pf
EFF
V ~ 1.5v
(Bipolar Supply)
Z
AC TEST CIRCUIT
FIG 10:
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL - 0, VIH = 2.5
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16 mA.
Tester Impedance Z0 = 50
Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to similate a typical resistive load circuit.
ATE tester Includes jig capacitance.
AC CHARACTERISTICS - READ-ONLY OPERATIONS
VCC = 3.3V ± 0.3V, -55°C ≤ TA ≤ +125°C
Parameter
Symbol
-70
Min
Max
-90
Min
Max
-100
Min
Max
-120
Min
Max
Unit
Read Cycle Time (3)
tAVAV
tRC
70
90
100
120
ns
Address Access Time
tAVQV
tACC
70
90
100
120
ns
Chip Select Access Time
tELQV
tCE
70
90
100
120
ns
Page Access Time
tPACC
25
100
120
ns
Output Enable to Output Valid
tOLQV
tOE
30
40
50
ns
Chip Select High to Output High Z
tEHQZ
tDF
20
ns
Output Enable High to Output High Z
tGHQZ
tDF
20
ns
Output Hold from Addresses, CS# or OE#
Change, Whichever occurs rst
tAXQX
tOH
55
5
ns
Output Enable Hold
Time (1)
Read
tOEH
00
0
Toggle and
Data# Polling
10
1.
Guaranteed by design, not tested.
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