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參數(shù)資料
| 型號： | W7NCF512H21ISA3DM1G |
| 廠商： | MICROSEMI CORP-PMG MICROELECTRONICS |
| 元件分類： | PROM |
| 英文描述： | FLASH 3.3V PROM MODULE, XMA50 |
| 封裝： | CARD-50 |
| 文件頁數(shù)： | 6/13頁 |
| 文件大小： | 180K |
| 代理商： | W7NCF512H21ISA3DM1G |
March 2007
Rev. 2
W7NCF-H-M1 Series
2
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
White Electronic Designs
ENVIRONMENTAL CHARACTERIZATION
Item
Performance
Temperature Cycle
JEDEC - JESD STD A104 Temp condition N (-40°C to 85 °C) and soak mode 3; 200 cycles
Humidity
MIL-STD 810F, Method 507.4, Paragraph 4.5.2 - 10 day test per gure 507.4-1, 10 day test
Vibration
MIL-STD 810F, Method 514.5, procedure 1, category 24, 1 hour per axis
Shock
MIL-STD 810F, Method 516.5, procedure1, non-operational, 40g, SRS functional shock for ground equipment, three (3)
shock per axis (positive or negative).
JEDEC- JESD22-B, 104-A, test condition B,1500 g pulse, 0.5 msec
Altitude
MIL-STD 810F, Method 500.4, procedure II, modied to 80,000 ft and non operation 1 hr test duration at altitude
PRODUCT RELIABILITY
Item
Value
MTBF (@ 25°C)
> 4,000,000 Hours
Data reliability
< 1 Non-Recoverable Error in 1014 Bits Read
Endurance
> 4,000,000 write/erase cycles
PRODUCT PERFORMANCE
Item
Performance (PIO mode 4 true IDE)
Read Transfer Rate (Typical)
7MB/s
Write Transfer Rate (Typical)
5MB/s
Burst Transfer Rate
up to 16.7MB/s
Controller Overhead
(Command to DRQ)
1ms typical, 5ms (max)
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