參數(shù)資料
型號(hào): WEDPS512K32LV-15BC
廠商: WHITE ELECTRONIC DESIGNS CORP
元件分類: SRAM
英文描述: 512K X 32 MULTI DEVICE SRAM MODULE, 15 ns, PBGA143
封裝: 16 X 18 MM, PLASTIC, BGA-143
文件頁(yè)數(shù): 3/7頁(yè)
文件大小: 268K
代理商: WEDPS512K32LV-15BC
3
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
White Electronic Designs
WEDPS512K32V-XBX
June 2004
Rev. 5
Current Source
IOL
IOH
Ceff = 50 pf
D.U.T.
VZ
1.5V
(Bipolar Supply)
AC CHARACTERISTICS
VCC = 3.3V, -55°C ≤ TA ≤ +125°C
Parameter
Read Cycle
Symbol
-12
-15
-17
-20
Units
Min
Max
Min
Max
Min
Max
Min
Max
Read Cycle Time
tRC
12
15
17
20
ns
Address Access Time
tAA
12
15
17
20
ns
Output Hold from Address Change
tOH
0000
ns
Chip Select Access Time
tACS
12
15
17
20
ns
Output Enable to Output Valid
tOE
788
10
ns
Chip Select to Output in Low Z
tCLZ1
1111
ns
Output Enable to Output in Low Z
tOLZ1
0000
ns
Chip Disable to Output in High Z
tCHZ1
788
10
ns
Output Disable to Output in High Z
tOHZ1
788
10
ns
1. This parameter is guaranteed by design but not tested.
FIGURE 4 – AC TEST CIRCUIT
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC Test Conditions
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
AC CHARACTERISTICS
VCC = 3.3V, -55°C ≤ TA ≤ +125°C
Parameter
Write Cycle
Symbol
-12
-15
-17
-20
Units
Min
Max
Min
Max
Min
Max
Min
Max
Write Cycle Time
tWC
12
15
17
20
ns
Chip Select to End of Write
tCW
10
12
14
ns
Address Valid to End of Write
tAW
10
12
14
ns
Data Valid to End of Write
tDW
8
9
10
ns
Write Pulse Width
tWP
10
12
14
ns
Address Setup Time
tAS
0000
ns
Address Hold Time
tAH
0000
ns
Output Active from End of Write
tOW1
2233
ns
Write Enable to Output in High Z
tWHZ1
7889
ns
Data Hold Time
tDH
0000
ns
1. This parameter is guaranteed by design but not tested.
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