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參數(shù)資料
| 型號(hào)： | WF128K32-90G2UM5 |
| 廠商： | MICROSEMI CORP-PMG MICROELECTRONICS |
| 元件分類： | PROM |
| 英文描述： | 128K X 32 FLASH 5V PROM MODULE, 90 ns, CQFP68 |
| 封裝： | 22.40 X 22.40 MM, 3.56 MM HEIGHT, HERMETIC SEALED, CERAMIC, QFP-68 |
| 文件頁數(shù)： | 10/15頁 |
| 文件大小： | 420K |
| 代理商： | WF128K32-90G2UM5 |
4
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
WF128K32-XXX5
March 2006
Rev. 8
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS, CS# CONTROLLED
VCC = 5.0V, VSS = 0V, -55°C ≤ TA ≤ +125°C
FIGURE 4 – AC TEST CIRCUIT
Parameter
Symbol
-50
-60
-70
-90
-120
-150
Unit
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Write Cycle Time
tAVAV
tWC
50
60
70
90
120
150
ns
WE# Setup Time
tWLEL
tWS
000000
ns
CS# Pulse Width
tELEH
tCP
25
30
35
45
50
ns
Address Setup Time
tAVEL
tAS
000000
ns
Data Setup Time
tDVEH
tDS
25
30
45
50
ns
Data Hold Time
tEHDX
tDH
000000
ns
Address Hold Time
tELAX
tAH
40
45
50
ns
WE# Hold from WE# High
tEHWH
tWH
000000
ns
CS# Pulse Width High
tEHEL
tCPH
20
ns
Duration of Programming Operation
tWHWH1
14
s
Duration of Erase Operation
tWHWH2
2.2
60
2.2
60
2.2
60
2.2
60
2.2
60
2.2
60
sec
Read Recovery before Write
tGHEL
000000
ns
Chip Programming Time
12.5
sec
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 .
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC Test Conditions
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
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