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參數資料
| 型號： | WF1M32B-150HM3A |
| 英文描述： | 1Mx32 3.3V Flash Module |
| 中文描述： | 1Mx32 3.3V的閃存模塊 |
| 文件頁數： | 4/13頁 |
| 文件大小： | 492K |
| 代理商： | WF1M32B-150HM3A |
4
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
WF1M32B-XXX3
March 2006
Rev. 5
White Electronic Designs Corp. reserves the right to change products or specifications without notice.
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS – CS# CONTROLLED
V
CC
= 3.3V, V
SS
= 0V, -55°C ≤ T
A
≤ +125°C
Parameter
Symbol
-100
-120
-150
Unit
Min
100
0
45
0
45
0
45
20
Max
Min
120
0
50
0
50
0
50
20
Max
Min
150
0
50
0
50
0
50
20
Max
Write Cycle Time
Write Enable Setup Time
Chip Select Pulse Width
Address Setup Time
Data Setup Time
Data Hold Time
Address Hold Time
Chip Select Pulse Width High
Duration of Byte Programming Operation (1)
Sector Erase Time
Read Recovery Time (2)
Chip Programming Time
t
AVAV
t
WLEL
t
ELEH
t
AVEL
t
DVEH
t
EHDX
t
ELAX
t
EHEL
t
WHWH1
t
WHWH2
t
GHEL
t
WC
t
WS
t
CP
t
AS
t
DS
t
DH
t
AH
t
CPH
ns
ns
ns
ns
ns
ns
ns
ns
μs
sec
μs
sec
300
15
300
15
300
15
0
0
0
50
50
50
1. Typical value for t
WHWH1
is 9μs.
2. Guaranteed by design, but not tested.
AC TEST CIRCUIT
AC TEST CONDITIONS
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Typ
Unit
V
ns
V
V
V
IL
= 0, V
IH
= 2.5
5
1.5
1.5
NOTES:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z0 = 75 .
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
I
Current Source
D.U.T.
C = 50 pf
I
OL
V
≈
1.5V
(Bipolar Supply)
Z
Current Source
OH
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