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參數(shù)資料
| 型號(hào)： | WMS512K8BV-20FIEA |
| 元件分類： | SRAM |
| 英文描述： | 512K X 8 STANDARD SRAM, 20 ns, CDFP36 |
| 封裝： | CERAMIC, DFP-36 |
| 文件頁數(shù)： | 3/8頁 |
| 文件大?。?/td> | 109K |
| 代理商： | WMS512K8BV-20FIEA |
3
White Electronic Designs Corporation Phoenix, AZ (602) 437-1520
WMS512K8BV-XXXE
AC CHARACTERISTICS
(VCC = 3.3V, GND = 0V, TA = -55
°C to +125°C)
Parameter
Symbol
-15
-17
-20
Units
Read Cycle
Min
Max
Min
Max
Min
Max
Read Cycle Time
tRC
15
17
20
ns
Address Access Time
tAA
15
17
20
ns
Output Hold from Address Change
tOH
000
ns
Chip Select Access Time
tACS
15
17
20
ns
Output Enable to Output Valid
tOE
78
10
ns
Chip Select to Output in Low Z
tCLZ1
222
ns
Output Enable to Output in Low Z
tOLZ1
000
ns
Chip Disable to Output in High Z
tCHZ1
78
10
ns
Output Disable to Output in High Z
tOHZ1
78
10
ns
1. This parameter is guaranteed by design but not tested.
AC CHARACTERISTICS
(VCC = 3.3V, GND = 0V, TA = -55
°C to +125°C)
Parameter
Symbol
-15
-17
-20
Units
Write Cycle
Min
Max
Min
Max
Min
Max
Write Cycle Time
tWC
15
17
20
ns
Chip Select to End of Write
tCW
10
12
14
ns
Address Valid to End of Write
tAW
10
12
14
ns
Data Valid to End of Write
tDW
8910
ns
Write Pulse Width
tWP
12
14
ns
Address Setup Time
tAS
00
0
ns
Address Hold Time
tAH
00
0
ns
Output Active from End of Write
tOW1
23
3
ns
Write Enable to Output in High Z
tWHZ1
88
9
ns
Data Hold Time
tDH
00
0
ns
1. This parameter is guaranteed by design but not tested.
I
Current Source
D.U.T.
C
= 50 pf
eff
I
OL
V
≈ 1.5V
(Bipolar Supply)
Z
Current Source
OH
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75
.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC TEST CIRCUIT
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 2.5
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
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