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參數(shù)資料
| 型號(hào)： | WS1M32V-25G3C |
| 英文描述： | 1Mx32 SRAM 3.3V MODULE |
| 中文描述： | 1Mx32 SRAM的3.3模塊 |
| 文件頁(yè)數(shù)： | 3/6頁(yè) |
| 文件大?。?/td> | 315K |
| 代理商： | WS1M32V-25G3C |
WS1M32V-XG3X
PRELIMINARY
3
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
White Electronic Designs Corp. reserves the right to change products or specifications without notice.
February, 2001
Rev. 5
Notes:
VZ is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z0 = 75.
VZ is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
I
OH
Current Source
D.U.T.
C
eff
= 50 pf
I
OL
V
Z
1.5V
(Bipolar Supply)
Current Source
AC TEST CONDITIONS
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Typ
Unit
V
ns
V
V
V
IL
= 0, V
IH
= 2.5
5
1.5
1.5
AC CHARACTERISTICS
V
CC
= 3.3V, GND = 0V, -55°C ≤ T
A
≤ +125°C
Parameter
Read Cycle
Read Cycle Time
Address Access Time
Output Hold from Address Change
Chip Select Access Time
Output Enable to Output Valid
Chip Select to Output in Low Z
Output Enable to Output in Low Z
Chip Disable to Output in High Z
Output Disable to Output in High Z
1. This parameter is guaranteed by design but not tested.
Symbol
-17
-20
-25
Units
Min
17
Max
Min
20
Max
Min
25
Max
t
RC
t
AA
t
OH
t
ACS
t
OE
t
CLZ
1
t
OLZ
1
t
CHZ
1
t
OHZ
1
ns
ns
ns
ns
ns
ns
ns
ns
ns
17
20
25
0
0
0
17
10
20
10
25
12
1
0
1
0
1
0
12
12
12
12
12
12
AC CHARACTERISTICS
V
CC
= 3.3V, GND = 0V, -55°C ≤ T
A
≤ +125°C
-17
Min
t
WC
17
t
CW
15
t
AW
15
t
DW
11
t
WP
15
t
AS
2
t
AH
0
t
OW
1
2
t
WHZ
1
t
DH
0
Parameter
Write Cycle
Write Cycle Time
Chip Select to End of Write
Address Valid to End of Write
Data Valid to End of Write
Write Pulse Width
Address Setup Time
Address Hold Time
Output Active from End of Write
Write Enable to Output in High Z
Data Hold Time
1. This parameter is guaranteed by design but not tested.
Symbol
-20
-25
Units
Max
Min
20
15
15
12
15
2
0
3
Max
Min
25
17
17
13
17
2
0
4
Max
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
9
11
13
0
0
AC TEST CIRCUIT
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| WS1M32V-25G3CA | 1Mx32 SRAM 3.3V MODULE |
| WS1M32V-25G3I | 1Mx32 SRAM 3.3V MODULE |
| WS1M32V-25G3IA | 1Mx32 SRAM 3.3V MODULE |
| WS1M32V-25G3M | 1Mx32 SRAM 3.3V MODULE |
| WS1M32V-25G3MA | 1Mx32 SRAM 3.3V MODULE |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| WS1M32V-25G3CA | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:1Mx32 SRAM 3.3V MODULE |
| WS1M32V-25G3I | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:1Mx32 SRAM 3.3V MODULE |
| WS1M32V-25G3IA | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:1Mx32 SRAM 3.3V MODULE |
| WS1M32V-25G3M | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:1Mx32 SRAM 3.3V MODULE |
| WS1M32V-25G3MA | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:1Mx32 SRAM 3.3V MODULE |
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