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參數(shù)資料
| 型號(hào)： | WS1M8V-55CM |
| 英文描述： | 2x512Kx8 DUALITHICTM SRAM |
| 中文描述： | 2x512Kx8 DUALITHICTM的SRAM |
| 文件頁數(shù)： | 3/5頁 |
| 文件大?。?/td> | 273K |
| 代理商： | WS1M8V-55CM |
WS1M8V-XCX
ADVANCED*
3
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
October, 2002
Rev. 2
White Electronic Designs Corp. reserves the right to change products or specifications without notice.
AC CHARACTERISTICS
V
CC
= 3.3V, GND = 0V, -55°C ≤ T
A
≤ +125°C)
-17
-20
Min
Max
Min
17
20
17
0
0
17
2
2
9
Parameter
Read Cycle
Read Cycle Time
Address Access Time
Output Hold from Address Change
Chip Select Access Time
Chip Select to Output in Low Z
Chip Disable to Output in High Z
NOTES:
1. This parameter is guaranteed by design but not tested.
2. OE# is internally tied to GND.
Symbol
-25
-35
-45
-55
Units
Max
Min
25
Max
Min
35
Max
Min
45
Max
Min
55
Max
t
RC
t
AA
t
OH
t
ACS
t
CLZ
1
t
CHZ
1
ns
ns
ns
ns
ns
ns
20
25
35
45
55
0
0
0
0
20
25
35
45
55
2
4
4
4
10
12
15
20
20
AC CHARACTERISTICS
V
CC
= 3.3V, GND = 0V, -55°C ≤ T
A
≤ +125°C)
-17
-20
Min
Max
Min
17
20
14
14
14
14
9
10
14
14
0
0
0
0
2
3
9
0
0
Parameter
Write Cycle
Write Cycle Time
Chip Select to End of Write
Address Valid to End of Write
Data Valid to End of Write
Write Pulse Width
Address Setup Time
Address Hold Time
Output Active from End of Write
Write Enable to Output in High Z
Data Hold Time
NOTES:
1. This parameter is guaranteed by design but not tested.
Symbol
-25
-35
-45
-55
Units
Max
Min
25
15
15
10
15
0
0
4
Max
Min
35
25
25
20
25
0
0
4
Max
Min
45
35
35
25
35
0
5
5
Max
Min
55
50
50
25
40
0
5
5
Max
t
WC
t
CW
t
AW
t
DW
t
WP
t
AS
t
AH
t
OW
1
t
WHZ
1
t
DH
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
9
10
15
15
25
0
0
0
0
I
Current Source
D.U.T.
C = 50 pf
I
OL
V
≈
1.5V
(Bipolar Supply)
Current Source
OH
AC TEST CIRCUIT
AC TEST CONDITIONS
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Notes:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z0 = 75 .
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load cir cuit.
ATE tester includes jig capacitance.
Typ
Unit
V
ns
V
V
V
IL
= 0, V
IH
= 3.0
5
1.5
1.5
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| WS1M8V-55CMA | 制造商:WEDC 制造商全稱:White Electronic Designs Corporation 功能描述:2x512Kx8 DUALITHICTM SRAM |
| WS1M8V-XCX | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:2X512KX8 Dualithic SRAM Advanced |
| WS1M8-XCX | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:2X512X8 Dualithic SRAM Preliminary |
| WS1M8-XDJX | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:SRAM MCP |
| WS1M8-XFX | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:SRAM MCP |
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