11
FN8161.4
December 4, 2009
DC Operating SpecificationsOver the recommended operating conditions unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNITS
ICC1
VCC Supply Current (Active)
fSCL = 400kHz; VCC = +5.5V; SDA = Open;
(for 2-wire, Active, Read and Volatile Write States only)
3mA
ICC2
VCC Supply Current (Nonvolatile Write) fSCL = 400kHz; VCC = +5.5V; SDA = Open;
(for 2-wire, Active, Non-volatile Write State only)
7mA
ISB
VCC Current (Standby)
VCC = +5.5V; VIN = VSS or VCC; SDA = VCC;
(for 2-wire, Standby State only)
15
μA
ILI
Input Leakage Current
VIN = VSS to VCC
10
μA
ILO
Output Leakage Current
VOUT = VSS to VCC
10
μA
VIH
Input HIGH Voltage
VCC x 0.7
VCC + 1
V
VIL
Input LOW Voltage
-1
VCC x 0.3
V
VOL
Output LOW Voltage
IOL = 3mA
0.4
V
Endurance and Data Retention
PARAMETER
MIN
UNITS
Minimum Endurance
100,000
Data changes per bit per register
Data Retention
100
years
Capacitance
SYMBOL
TEST
TYP
UNITS
TEST CONDITIONS
CIN/OUT (Note 9) Input/Output Capacitance (SI) 8
pF
VOUT = 0V
Input Capacitance (SCL, WP, A1 and A0)
6
pF
VIN = 0V
Power-Up Timing
SYMBOL
PARAMETER
MIN
MAX
UNITS
VCC Power-up Rate
0.2
50
V/ms
Power-up to Initiation of Read Operation
1
ms
Power-up to Initiation of Write Operation
50
ms
NOTES:
9. This parameter is not 100% tested
10. tPUR and tPUW are the delays required from the time the (last) power supply (VCC-) is stable until the specific instruction can be issued. These
parameters are periodically sampled and not 100% tested.
AC Test Conditions
Input Pulse Levels
VCC x 0.1 to VCC x 0.9
Input Rise and Fall Times
10ns
Input and Output Timing Level
VCC x 0.5
X9118