參數(shù)資料
      型號: XC4010E-3HQ208C
      廠商: Xilinx Inc
      文件頁數(shù): 32/68頁
      文件大?。?/td> 0K
      描述: IC FPGA C-TEMP 5V 3SPD 208-HQFP
      產(chǎn)品變化通告: XC4000(XL,XLA,E) Discontinuation 15/Nov/2004
      標準包裝: 24
      系列: XC4000E/X
      LAB/CLB數(shù): 400
      邏輯元件/單元數(shù): 950
      RAM 位總計: 12800
      輸入/輸出數(shù): 160
      門數(shù): 10000
      電源電壓: 4.75 V ~ 5.25 V
      安裝類型: 表面貼裝
      工作溫度: 0°C ~ 85°C
      封裝/外殼: 208-BFQFP 裸露焊盤
      供應(yīng)商設(shè)備封裝: 208-PQFP(28x28)
      R
      XC4000E and XC4000X Series Field Programmable Gate Arrays
      6-42
      May 14, 1999 (Version 1.6)
      Boundary Scan
      The ‘bed of nails’ has been the traditional method of testing
      electronic assemblies. This approach has become less
      appropriate, due to closer pin spacing and more sophisti-
      cated assembly methods like surface-mount technology
      and multi-layer boards. The IEEE Boundary Scan Standard
      1149.1 was developed to facilitate board-level testing of
      electronic assemblies. Design and test engineers can
      imbed a standard test logic structure in their device to
      achieve high fault coverage for I/O and internal logic. This
      structure is easily implemented with a four-pin interface on
      any boundary scan-compatible IC. IEEE 1149.1-compati-
      ble devices may be serial daisy-chained together, con-
      nected in parallel, or a combination of the two.
      The XC4000 Series implements IEEE 1149.1-compatible
      BYPASS, PRELOAD/SAMPLE and EXTEST boundary
      scan instructions. When the boundary scan conguration
      option is selected, three normal user I/O pins become ded-
      icated inputs for these functions. Another user output pin
      becomes the dedicated boundary scan output. The details
      of how to enable this circuitry are covered later in this sec-
      tion.
      By exercising these input signals, the user can serially load
      commands and data into these devices to control the driv-
      ing of their outputs and to examine their inputs. This
      method is an improvement over bed-of-nails testing. It
      avoids the need to over-drive device outputs, and it reduces
      the user interface to four pins. An optional fth pin, a reset
      for the control logic, is described in the standard but is not
      implemented in Xilinx devices.
      The dedicated on-chip logic implementing the IEEE 1149.1
      functions includes a 16-state machine, an instruction regis-
      ter and a number of data registers. The functional details
      can be found in the IEEE 1149.1 specication and are also
      discussed in the Xilinx application note XAPP 017: “
      Bound-
      ary Scan in XC4000 Devices.”
      Figure 40 on page 43 shows a simplied block diagram of
      the XC4000E Input/Output Block with boundary scan
      implemented. XC4000X boundary scan logic is identical.
      CS0, CS1,
      WS, RS
      I
      I/O
      These four inputs are used in Asynchronous Peripheral mode. The chip is selected
      when CS0 is Low and CS1 is High. While the chip is selected, a Low on Write Strobe
      (WS) loads the data present on the D0 - D7 inputs into the internal data buffer. A Low
      on Read Strobe (RS) changes D7 into a status output — High if Ready, Low if Busy —
      and drives D0 - D6 High.
      In Express mode, CS1 is used as a serial-enable signal for daisy-chaining.
      WS and RS should be mutually exclusive, but if both are Low simultaneously, the Write
      Strobe overrides. After configuration, these are user-programmable I/O pins.
      A0 - A17
      O
      I/O
      During Master Parallel configuration, these 18 output pins address the configuration
      EPROM. After configuration, they are user-programmable I/O pins.
      A18 - A21
      (XC4003XL to
      XC4085XL)
      O
      I/O
      During Master Parallel configuration with an XC4000X master, these 4 output pins add
      4 more bits to address the configuration EPROM. After configuration, they are user-pro-
      grammable I/O pins. (See Master Parallel Configuration section for additional details.)
      D0 - D7
      I
      I/O
      During Master Parallel and Peripheral configuration, these eight input pins receive con-
      figuration data. After configuration, they are user-programmable I/O pins.
      DIN
      I
      I/O
      During Slave Serial or Master Serial configuration, DIN is the serial configuration data
      input receiving data on the rising edge of CCLK. During Parallel configuration, DIN is
      the D0 input. After configuration, DIN is a user-programmable I/O pin.
      DOUT
      O
      I/O
      During configuration in any mode but Express mode, DOUT is the serial configuration
      data output that can drive the DIN of daisy-chained slave FPGAs. DOUT data changes
      on the falling edge of CCLK, one-and-a-half CCLK periods after it was received at the
      DIN input.
      In Express modefor XC4000E and XC4000X only, DOUT is the status output that can
      drive the CS1 of daisy-chained FPGAs, to enable and disable downstream devices.
      After configuration, DOUT is a user-programmable I/O pin.
      Unrestricted User-Programmable I/O Pins
      I/O
      Weak
      Pull-up
      I/O
      These pins can be configured to be input and/or output after configuration is completed.
      Before configuration is completed, these pins have an internal high-value pull-up resis-
      tor (25 k
      - 100 k) that defines the logic level as High.
      Table 16: Pin Descriptions (Continued)
      Pin Name
      I/O
      During
      Cong.
      I/O
      After
      Cong.
      Pin Description
      Product Obsolete or Under Obsolescence
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