參數(shù)資料
型號(hào): 100355D
廠商: National Semiconductor Corporation
英文描述: Low Power Quad Multiplexer/Latch
中文描述: 低功耗四復(fù)用器/鎖存
文件頁(yè)數(shù): 4/10頁(yè)
文件大?。?/td> 148K
代理商: 100355D
Absolute Maximum Ratings
(Note 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
which the useful life may be impaired.
Above
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
Ceramic
V
EE
Pin Potential to Ground Pin
Input Voltage (DC)
Output Current (DC Output HIGH)
65C to +150C
+175C
7.0V to +0.5V
V
EE
to +0.5V
50 mA
ESD (Note 3)
2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
Supply Voltage (V
EE
)
Note 2:
Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 3:
ESD testing conforms to MIL-STD-883, Method 3015.
55C to +125C
5.7V to 4.2V
Military Version
DC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND, T
C
= 55C to +125C
Symbol
Parameter
V
OH
Output HIGH Voltage
Min
1025
1085
1830
1830
1035
1085
Max
870
870
1620
1555
Units
mV
mV
mV
mV
mV
mV
mV
mV
mV
T
C
Conditions
Notes
0C to +125C
55C
0C to +125C
55C
0C to +125C
55C
0C to +125C
55C
55C to
+125C
55C to
+125C
55C to
+125C
V
IN
= V
IH (Max)
or V
IL (Min)
Loading with
50
to 2.0V
(Notes 4, 5,
6)
V
OL
Output LOW Voltage
V
OHC
Output HIGH Voltage
V
IN
= V
IH (Min)
or V
IL (Max)
Loading with
50
to 2.0V
(Notes 4, 5,
6)
V
OLC
Output LOW Voltage
1610
1555
870
V
IH
Input HIGH Voltage
1165
Guaranteed HIGH Signal
for ALL Inputs
Guaranteed LOW Signal
for ALL Inputs
V
EE
= 4.2V
V
IN
= V
IL (Min)
(Notes 4, 5,
6, 7)
V
IL
Input LOW Voltage
1830
1475
mV
(Notes 4, 5,
6, 7)
I
IL
Input LOW Current
0.50
μA
(Notes 4, 5,
6)
I
IH
Input HIGH Current
S
0
, S
1
E
1
, E
2
D
na
–D
nd
MR
S
0
, S
1
E
1
, E
2
D
na
–D
nd
MR
Power Supply Current
220
350
340
430
320
500
490
630
32
μA
0C to +125C
V
EE
= 5.7V
V
IN
= V
IH (Max)
(Notes 4, 5,
6)
μA
55C
I
EE
95
mA
55C to +125C
Inputs Open
(Notes 4, 5,
6)
Note 4:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 5:
Screen tested 100% on each device at 55C, +25C, and +125C Temp., Subgroups 1, 2, 3, 7, and 8.
Note 6:
Sample tested (Method 5005, Table 1) on each Mfg. lot at +25, +125C, and 55C Temp., Subgroups 1, 2, 3, 7, and 8.
Note 7:
Guaranteed by applying specified input condition and testing V
OH
/V
OL
.
www.national.com
4
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