參數(shù)資料
型號(hào): 100355D
廠商: National Semiconductor Corporation
英文描述: Low Power Quad Multiplexer/Latch
中文描述: 低功耗四復(fù)用器/鎖存
文件頁(yè)數(shù): 5/10頁(yè)
文件大?。?/td> 148K
代理商: 100355D
Military Version
AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
Min
T
C
= +25C
Min
T
C
= +125C
Min
Units
Conditions
Notes
Max
Max
Max
t
PLH
t
PHL
Propagation Delay
D
na
–D
nd
to Output
(Transparent Mode)
Propagation Delay
S
0
, S
1
to Output
(Transparent Mode)
Propagation Delay
E
1
, E
2
to Output
Propagation Delay
MR to Output
Transition Time
20% to 80%, 80% to 20%
Setup Time
D
na
–D
nd
S
0
, S
1
MR (Release Time)
Hold Time
D
na
–D
nd
S
0
, S
1
Pulse Width LOW E
1
, E
2
Pulse Width HIGH MR
0.40
2.30
0.50
2.20
0.50
2.60
ns
t
PLH
t
PHL
Figures 1, 2
(Notes 8, 9,
10)
0.60
3.00
0.80
2.70
0.80
3.20
ns
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
t
S
0.50
2.60
0.60
2.30
0.70
2.70
ns
0.60
2.80
0.70
2.60
0.70
2.90
ns
Figures 1, 3
(Notes 8, 9,
10)
0.40
1.90
0.40
1.90
0.40
1.90
ns
Figures 1, 2
(Note 11)
0.90
2.40
1.50
0.90
2.40
1.50
0.90
2.40
1.50
ns
Figure 4
(Note 11)
Figure 3
t
H
0.40
0.00
2.00
2.00
0.40
0.00
2.00
2.00
0.40
0.00
2.00
2.00
ns
Figure 4
(Note 11)
t
pw
(L)
t
pw
(H)
ns
ns
Figure 2
Figure 3
(Note 11)
(Note 11)
Note 8:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 9:
Screen tested 100% on each device at +25C, Temperature only, Subgroup A9.
Note 10:
Sample tested (Method 5005, Table 1) on each Mfg. lot at +25, Subgroup A9, and at +125C, and 55C Temp., Subgroups A10 & A11.
Note 11:
Not tested at +25C, +125C and 55C Temperature (design characterization data).
5
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