參數(shù)資料
型號(hào): 2SK4077-ZK-E1-AY
元件分類: 小信號(hào)晶體管
英文描述: 20000 mA, 40 V, N-CHANNEL, Si, SMALL SIGNAL, MOSFET, TO-252AA
封裝: LEAD FREE, TO-252, MP-3ZK, 3 PIN
文件頁數(shù): 2/8頁
文件大?。?/td> 169K
代理商: 2SK4077-ZK-E1-AY
Data Sheet D18461EJ1V0DS
2
2SK4077
ELECTRICAL CHARACTERISTICS (TA = 25
°C)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Zero Gate Voltage Drain Current
IDSS
VDS = 40 V, VGS = 0 V
1
μA
Gate Leakage Current
IGSS
VGS =
±20 V, VDS = 0 V
±10
μA
Gate Cut-off Voltage
VGS(off)
VDS = 10 V, ID = 1 mA
1.5
2.0
2.5
V
Forward Transfer Admittance
Note
| yfs |
VDS = 10 V, ID = 4 A
3.2
6.3
S
Drain to Source On-state Resistance
Note
RDS(on)1
VGS = 10 V, ID = 10 A
16
20
m
Ω
RDS(on)2
VGS = 4.5 V, ID = 5 A
22
35
m
Ω
Input Capacitance
Ciss
VDS = 10 V
800
pF
Output Capacitance
Coss
VGS = 0 V
130
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
88
pF
Turn-on Delay Time
td(on)
VDD = 20 V, ID = 10 A
11
ns
Rise Time
tr
VGS = 10 V
4
ns
Turn-off Delay Time
td(off)
RG = 0
Ω
29
ns
Fall Time
tf
4
ns
Total Gate Charge
QG
VDD = 32 V
18
nC
Gate to Source Charge
QGS
VGS = 10 V
3
nC
Gate to Drain Charge
QGD
ID = 20 A
6
nC
Body Diode Forward Voltage
Note
VF(S-D)
IF = 20 A, VGS = 0 V
0.9
1.5
V
Reverse Recovery Time
trr
IF = 20 A, VGS = 0 V
20
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/
μs
20
nC
Note Pulsed
TEST CIRCUIT 3 GATE CHARGE
VGS = 20
0 V
PG.
RG = 25
Ω
50
Ω
D.U.T.
L
VDD
TEST CIRCUIT 1 AVALANCHE CAPABILITY
PG.
D.U.T.
RL
VDD
TEST CIRCUIT 2 SWITCHING TIME
RG
PG.
IG = 2 mA
50
Ω
D.U.T.
RL
VDD
ID
VDD
IAS
VDS
BVDSS
Starting Tch
VGS
0
τ = 1 s
Duty Cycle
1%
τ
VGS
Wave Form
VDS
Wave Form
VGS
VDS
10%
0
90%
VGS
VDS
ton
toff
td(on)
tr
td(off)
tf
10%
μ
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