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參數(shù)資料
| 型號： | 4MBI200T-060 |
| 廠商： | FUJI ELECTRIC CO LTD |
| 元件分類： | IGBT 晶體管 |
| 英文描述： | IGBT Module |
| 中文描述： | 200 A, 600 V, N-CHANNEL IGBT |
| 封裝： | MODULE-24 |
| 文件頁數(shù)： | 13/14頁 |
| 文件大小： | 643K |
| 代理商： | 4MBI200T-060 |
H04-004-03
14
MS5F 05498
8
Failu re Criteria
Item
C haracteristic
Sym bol
Failure criteria
Unit
Note
Lower lim it
Upper lim it
Electrical
Leakage current
ICES
-
USL× 2
m A
characteristic
±IGES
-
USL× 2
A
Gate threshold voltage
VGE(th)
LSL×0.8
USL×1.2
m A
Saturation voltage
VCE(sat)
-
USL×1.2
V
Forward voltage
VF
-
USL×1.2
V
Therm al
IGBT
VGE
-
USL×1.2
m V
resistance
or
VC E
FW D
VF
-
USL×1.2
m V
Isolation voltage
Viso
Broken insulation
-
Visual
Visual inspection
inspection
Peeling
-
The visual sam ple
-
Plating
and the others
LSL : Low er specified lim it.
USL : Upper specified lim it.
Note : Each param eter m easurem ent read-outs shall be m ade after stabilizing the com ponents at room
am bient for 2 hours m inim um , 24 hours m axim um after rem oval from the tests. And in case of the
wetting tests, for exam ple, m oisture resistance tests, each com ponent shall be m ade w ipe or dry
com pletely before the m easurem ent.
Each param eter m easurem ent read-outs shall be m ade after stabilizing the com ponents at room
am bient for 2 hours m inim um , 24 hours m axim um after rem oval from the tests. And in case of the
wetting tests, for exam ple, m oisture resistance tests, each com ponent shall be m ade w ipe or dry
com pletely before the m easurem ent.
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Number
of
sample
Accept-
ance
number
1 High temperature
Test Method 101
5
( 0 : 1 )
Reverse Bias
Test temp.
: Ta = 125±5 ℃
(Tj ≦ 150 ℃)
Bias Voltage
: VC = 0.8×VCES
Bias Method
: Applied DC voltage to C-E
VGE = 0V
Test duration
: 1000hr.
2 High temperature
Test Method 101
5
( 0 : 1 )
Bias (for gate)
Test temp.
: Ta = 125±5 ℃
(Tj ≦ 150 ℃)
Bias Voltage
: VC = VGE = +20V or -20V
Bias Method
: Applied DC voltage to G-E
VCE = 0V
Test duration
: 1000hr.
3 Temperature
Test Method 102
5
( 0 : 1 )
Humidity Bias
Test temp.
: 85±2 oC
Condition code C
Relative humidity
: 85±5%
Bias Voltage
: VC = 0.8×VCES
Bias Method
: Applied DC voltage to C-E
VGE = 0V
Test duration
: 1000hr.
4 Intermitted
ON time
: 2 sec.
Test Method 106
5
( 0 : 1 )
Operating Life
OFF time
: 18 sec.
(Power cycle)
Test temp.
:
Tj=100±5 deg
( for IGBT )
Tj ≦ 150 ℃, Ta=25±5 ℃
Number of cycles
: 15000 cycles
E
nd
ur
an
ce
T
es
ts
E
nd
ur
an
ce
T
es
ts
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