TLC372, TLC372Q, TLC372Y
LinCMOS
DUAL DIFFERENTIAL COMPARATORS
SLCS114B – NOVEMBER 1983 – REVISED MARCH 1999
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics at specified free-air temperature, VDD = 5 V, TA = 25°C (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
TLC372Y
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIO
Input offset voltage
VIC = VICRmin,
See Note 4
1
5
mV
IIO
Input offset current
1
pA
IIB
Input bias current
5
pA
VICR
Common-mode input voltage range
0 to
VDD –1
V
IOH
High-level output current
VID = 1 V,
VOH = 5 V
0.1
nA
VOL
Low-level output voltage
VID = – 1 V,
IOL = 4 mA
150
400
mV
IOL
Low-level output current
VID = – 1 V,
VOL = 1.5 V
6
16
mA
IDD
Supply current (two comparators)
VID = 1 V,
No load
150
300
A
All characteristics are measured with zero common-mode input voltage unless otherwise noted. IMPORTANT: See Parameter Measurement
Information.
NOTE 4: The offset voltage limits given are the maximum values required to drive the output above 4 V or below 400 mV with a 10-k
resistor
between the output and VDD. They can be verified by applying the limit value to the input and checking for the appropriate output state.
PARAMETER MEASUREMENT INFORMATION
The digital output stage of the TLC372 can be damaged if it is held in the linear region of the transfer curve.
Conventional operational amplifier/comparator testing incorporates the use of a servo loop that is designed to force
the device output to a level within this linear region. Since the servo-loop method of testing cannot be used, the
following alternatives for measuring parameters such as input offset voltage, common-mode rejection, etc., are
offered.
To verify that the input offset voltage falls within the limits specified, the limit value is applied to the input as shown
in Figure 1(a). With the noninverting input positive with respect to the inverting input, the output should be high. With
the input polarity reversed, the output should be low.
A similar test can be made to verify the input offset voltage at the common-mode extremes. The supply voltages can
be slewed as shown in Figure 1(b) for the VICR test, rather than changing the input voltages, to provide greater
accuracy.
5 V
5.1 k
VO
Applied VIO
Limit
VO
5.1 k
1 V
–4 V
–
+
–
+
(a) VIO WITH VIC = 0
(b) VIO WITH VIC = 4 V
Applied VIO
Limit
Figure 1. Method for Verifying That Input Offset Voltage is Within Specified Limits