參數(shù)資料
型號(hào): 5962-9169002M3X
廠商: ANALOG DEVICES INC
元件分類: ADC
英文描述: 1-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, CQCC28
封裝: CERAMIC, CC-28
文件頁數(shù): 19/22頁
文件大?。?/td> 294K
代理商: 5962-9169002M3X
STANDARDIZED
MICROCIRCUIT DRAWING
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
SIZE
A
5962-91690
REVISION LEVEL
B
SHEET
4
DESC FORM 193A
JUL 94
BULLETIN
MILITARY
MIL-BUL-103
-
List of Standardized Military Drawings (SMD's).
HANDBOOK
MILITARY
MIL-HDBK-780
-
Standardized Military Drawings.
(Copies of the specifications, standards, bulletin, and handbook required by manufacturers in connection with specific acquisition
functions should be obtained from the contracting activity or as directed by the contracting activity.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing shall take precedence.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883,
"Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices" and as specified herein. The individual
item requirements for device classes Q and V shall be in accordance with MIL-I-38535, the device manufacturer's Quality
Management (QM) plan, and as specified herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-STD-883 (see 3.1 herein) for classes M and MIL-I-38535 for device classes Q and V and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth table. The truth table shall be as specified on figure 2.
3.2.4 Block or logic diagram. The block or logic diagram shall be as specified on figure 3.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical
performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient
operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are described in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M shall be in accordance with
MIL-STD-883 (see 3.1 herein). In addition, the manufacturer's PIN may also be marked as listed in MIL-BUL-103. Marking for
device classes Q and V shall be in accordance with MIL-I-38535.
3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a "C" as required in
MIL-STD-883 (see 3.1 herein). The certification mark for device classes Q and V shall be a "QML" as required in MIL-I-38535.
3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a manufacturer in order
to be listed as an approved source of supply in MIL-BUL-103 (see 6.7.2 herein). For device classes Q and V, a certificate of
compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see
6.7.1 herein). The certificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein),
or for device classes Q and V, the requirements of MIL-I-38535 and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STD-883 (see 3.1 herein)
or for device classes Q and V in MIL-I-38535 shall be provided with each lot of microcircuits delivered to this drawing.
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