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參數(shù)資料
| 型號： | 5962-97557 |
| 元件分類： | 運動控制電子 |
| 英文描述： | Hermetically Sealed Analog Isolation Amplifier(密封模擬隔離放大器) |
| 中文描述： | 密封的模擬隔離放大器（密封模擬隔離放大器） |
| 文件頁數(shù)： | 6/16頁 |
| 文件大?。?/td> | 252K |
| 代理商： | 5962-97557 |
6
AC Electrical Specifications
Over recommended operating conditions (T
A
= –55C to +125C, V
IN+
= 0 V, V
IN–
= 0 V, V
DD1
= 5 V and
V
DD2
= 5 V, unless otherwise specified).
Group A
[12]
Parameter
Symbol
Subgroups
Min.
Typ.* Max. Units
Common Mode
CMR
9
5
Rejection
Test Conditions
V
CM
= 1 kV
4.5 V
≤
(V
DD1
, V
DD2
)
≤
5.5 V, T
A
= 25C
V
IN+
= 0 to 100 mV step 18,19
4.5 V
≤
(V
DD1
, V
DD2
)
≤
5.5 V
Fig. Note
16
8
kV/
μ
s
8,13
Propagation
Delay to 50%
t
PD50
9,10,11
3.7
7.5
μ
s
Propagation
Delay to 90%
Rise/Fall
Time (10-90%)
Small-Signal
Bandwidth
(–3 dB)
Small-Signal
Bandwidth
(–45)
RMS Input-
Referred Noise
Power Supply
Rejection
t
PD90
9,10,11
5.7
11.0
t
R/F
9,10,11
3.4
7.5
f
–3 dB
9,10,11
45
100
kHz
4.5 V
≤
(V
DD1
, V
DD2
)
≤
5.5 V
18,20,
21
14
f
–45
31
V
N
0.6
mV
rms
In recommended
application circuit
mV
P–P
22,24
9
PSR
570
10
*All typicals are at the nominal operating conditions of V
IN+
= 0 V, V
IN–
= 0 V, T
A
= 25C, V
DD1
= 5 V and V
DD2
= 5 V.
Notes:
1. If V
IN–
is brought above V
DD1
–2 V with respect to GND1 an internal test mode may be activated. This test mode is not intended for
customer use.
2. Exact offset value is dependent on layout of external bypass capacitors. The offset value in the data sheet corresponds to Agilent’s
recommended layout (see Figures 26 and 27).
3. Nonlinearity is defined as half of the peak-to-peak output deviation from the best-fit gain line, expressed as a percentage of the full-scale
differential output voltage.
4. Because of the switched capacitor nature of the sigma-delta A/D converter, time averaged values are shown.
5. CMRR
IN
is defined as the ratio of the gain for differential inputs applied between pins 2 and 3 to the gain for both common mode inputs
applied to both pins 2 and 3 with respect to pin 4.
6. When the differential input signal exceeds approximately 320 mV, the outputs will limit at the typical values shown.
7. Short-circuit current is the amount of output current generated when either output is shorted to V
DD2
or ground. Agilent does not
recommend operations under these conditions.
8. CMR (also known as IMR or Isolation Mode Rejection) specifies the minimum rate of rise of a common mode signal applied across the
isolation boundary at which small output perturbations begin to occur. These output perturbations can occur with both the rising and
falling edges of the common mode waveform and may be of either polarity. A CMR failure is defined as a perturbation exceeding 200 mV
at the output of the recommended application circuit (Figure 24). See Applications section for more information on CMR.
9. Output noise comes from two primary sources: chopper noise and sigma-delta quantization noise. Chopper noise results from chopper
stabilization of the output op-amps. It occurs at a specific frequency (typically 500 kHz) and is not attenuated by the on-chip output
filter. The on-chip filter does eliminate most, but not all, of the sigma-delta quantization noise. An external filter circuit may be easily
added to the external post-amplifier to reduce the total RMS output noise. See Applications section for more information.
10. Data sheet value is the amplitude of the transient at the differential output of the HCPL-7850 when a 1 V
P–P
, 1 MHz square wave with
100 ns rise and fall times (measured at pins 1 and 8) is applied to both V
DD1
and V
DD2
.
11. Device considered a two-terminal device: Pins 1, 2, 3, and 4 are shorted together and pins 5, 6, 7, and 8 are shorted together.
12. Commercial parts receive 100% testing at 25C (Subgroups 1 and 9). Hi-Rel and SMD parts receive 100% testing at 25C, +125C and
–55C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively).
13. Parameters are tested as part of device initial characterization and after design and process changes only. Parameters are guaranteed to
limits specified for all lots not specifically tested.
14. The f
-3dB
test is guaranteed by the T
RISE
test.
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