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參數(shù)資料
| 型號： | 74ACT11882 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | 32-Bit Look-ahead Carry Generator(32位超前進位產生器) |
| 中文描述： | 32位前瞻卡里發(fā)生器（32位超前進位產生器） |
| 文件頁數(shù)： | 1/6頁 |
| 文件大?。?/td> | 58K |
| 代理商： | 74ACT11882 |
54ACT11882, 74ACT11882
32-BIT LOOK-AHEAD CARRY GENERATORS
SCAS392 – OCTOBER 1988
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
1988, Texas Instruments Incorporated
1
Capable of Anticipating the Carry Across a
Group of Eight 4-Bit Binary Adders
Cascadable to Perform Look-Ahead Across
n-Bit Adders
Typical Carry Time, C
n
to Any C
n+i
, is Less
Than 6 ns
Inputs are TTL-Voltage Compatible
New Flow-Through Architecture to
Optimize PCB Layout
Center-Pin V
CC
and GND Configurations to
Minimize High-Speed Switching Noise
EPIC (Enhanced-Performance Implanted
CMOS) 1- m Process
500-mA Typical Latch-Up Immunity at
125
°
C
Package Options Include Plastic “Small
Outline” Packages, Ceramic Chip Carriers,
and Standard Plastic and Ceramic 300-mil
DIPs
description
The ACT11882 is a high-speed look-ahead carry
generator capable of anticipating the carry across
a group of eight 4-bit adders permitting the
designer to implement look-ahead for a 32-bit ALU
with a single package or, by cascading ’T11882’s
full look-ahead is possible across n-bit adders.
The SN54ACT11882 is characterized for
operation over the full military temperature range
of –55
°
C to 125
°
C. The SN74ACT11882 is
characterized for operation from – 40
°
C to 85
°
C.
’11882 LOGIC EQUATIONS
C
n+8
= G1+P1G0+P1P0C
n
C
n+16
=G3+P3G2+P3P2G1+P3P2P1G0
+P3P2P1P0C
n
C
n+24
=G5+P5G4+P5P4G3+P5P4P3G2
+P5P4P3P2G1+P5P4P3P2P1G0
+P5P4P3P2P1P0C
n
C
n+32
=G7+P7G6+P7P6G5+P7P6P5G4
+P7P6P5P4G3+P7P6P5P4P3G2
+P7P6P5P4P3P2G1+P7P6P5P4P3P2P1G0
+P7P6P5P4P3P2P1P0C
n
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other specifications
are design goals. Texas Instruments reserves the right to change or
discontinue these products without notice.
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