參數(shù)資料
型號: 74F552
廠商: NXP Semiconductors N.V.
英文描述: Octal registered transceiver with parity and flags (3-State)(帶奇偶和標志位的八通道寄存收發(fā)器(三態(tài)))
中文描述: 八路注冊平等和旗幟(3態(tài))(帶奇偶和標志位的八收發(fā)器通道寄存收發(fā)器(三態(tài)))
文件頁數(shù): 7/14頁
文件大?。?/td> 115K
代理商: 74F552
Philips Semiconductors
Product specification
74F552
Octal registered transceiver with parity and flags (3-State)
1991 Jan 02
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
MIN
TYP
NO TAG
MAX
UNIT
FR FS ERROR
FR, FS, ERROR
= 1mA
I
OH
= –1mA
±
10%V
CC
2.5
V
±
5%V
CC
2.7
3.4
V
V
OH
High-level output
voltage
A0 A7
A0–A7
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
= 3mA
I
OH
= –3mA
±
10%V
CC
2.4
V
±
5%V
CC
2.7
3.3
V
B0 B7 PARITY
B0–B7, PARITY
= 15mA
I
OH
= –15mA
±
10%V
CC
2.0
V
±
5%V
CC
2.0
V
FR FS ERROR
FR. FS. ERROR
= 20mA
I
OL
±
10%V
CC
0.30
0.50
V
±
5%V
CC
0.30
0.50
V
V
OL
Low-level output
voltage
A0 A7
A0–A7
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
= 24mA
I
OL
±
10%V
CC
0.35
0.50
V
±
5%V
CC
0.35
0.50
V
B0 B7 PARITY
B0–B7, PARITY
I
OL
= 48mA
±
10%V
CC
0.38
0.55
V
I
OL
= 64mA
±
5%V
CC
0.42
0.55
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
Input current at
maximum input
voltage
others
V
CC
= MAX, V
I
= 7.0V
100
μ
A
I
I
A0–A7, B0–B7,
PARITY
V
CC
= 5.5V, V
I
= 5.5V
1
mA
I
IH
High-level input
current
others except
A0–A7, B0–B7,
PARITY
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input
current
others
V
CC
= MAX V = 0 5V
I
= 0.5V
–0.6
mA
OEAS, OEBA
–1.2
mA
I
OZH
+I
IH
Off-state output current
High-level voltage applied
A0–A7,
B0–B7,
PARITY
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
OZL
+I
IL
Off-state output current
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V
–600
μ
A
I
OS
Short-circuit
output
current
NO TAG
A0–A7, FS, FR,
ERROR
V
= MAX
CC
–60
–150
mA
B0–B7, PARITY
–100
–225
mA
I
CCH
115
170
mA
I
CC
Supply current
(total)
I
CCL
V
CC
= MAX
125
185
mA
I
CCZ
120
180
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
should be performed last.
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