CY74FCT16646T
CY74FCT162646T
4
Maximum Ratings
[4]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .....................Com’l
55
°
C to +125
°
C
Ambient Temperature with
Power Applied.................................Com’l
55
°
C to +125
°
C
DC Input Voltage
.................................................
0.5V to +7.0V
DC Output Voltage
..............................................
0.5V to +7.0V
DC Output Current
(Maximum Sink Current/Pin)
...........................
60 to +120 mA
Power Dissipation..........................................................1.0W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Operating Range
Range
Ambient
Temperature
V
CC
Industrial
40
°
C to +85
°
C
5V
±
10%
Electrical Characteristics
Over the Operating Range
Parameter
Description
V
IH
Input HIGH Voltage
V
IL
Input LOW Voltage
V
H
V
IK
Input Clamp Diode Voltage
I
IH
Input HIGH Current
I
IL
Input LOW Current
I
OZH
High Impedance Output Current
(Three-State Output pins)
I
OZL
High Impedance Output Current
(Three-State Output pins)
I
OS
I
O
I
OFF
Power-Off Disable
Test Conditions
Min.
2.0
Typ.
[5]
Max.
Unit
V
V
mV
V
μ
A
μ
A
μ
A
0.8
Input Hysteresis
[6]
100
0.7
V
CC
=Min., I
IN
=
18 mA
V
CC
=Max., V
I
=V
CC
V
CC
=Max., V
I
=GND
V
CC
=Max., V
OUT
=2.7V
1.2
±
1
±
1
±
1
V
CC
=Max., V
OUT
=0.5V
±
1
μ
A
Short Circuit Current
[7]
Output Drive Current
[7]
V
CC
=Max., V
OUT
=GND
V
CC
=Max., V
OUT
=2.5V
V
CC
=0V, V
OUT
≤
4.5V
[9]
80
50
140
200
180
±
1
mA
mA
μ
A
Output Drive Characteristics for CY74FCT16646T
Parameter
Description
V
OH
Output HIGH Voltage
Test Conditions
Min.
2.5
2.4
2.0
Typ.
[5]
3.5
3.5
3.0
0.2
Max.
Unit
V
V
V
V
V
CC
=Min., I
OH
=
3 mA
V
CC
=Min., I
OH
=
15 mA
V
CC
=Min., I
OH
=
32 mA
V
CC
=Min., I
OL
=64 mA
V
OL
Output LOW Voltage
0.55
Output Drive Characteristics for CY74FCT162646T
Parameter
Description
I
ODL
I
ODH
V
OH
Output HIGH Voltage
V
OL
Output LOW Voltage
Notes:
4.
Stresses greater than those listed under Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
5.
Typical values are at V
= 5.0V, T
= +25C ambient.
6.
This parameter is specified but not tested.
7.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametrics tests. In any sequence of parameter
tests, I
tests should be performed last.
8.
This parameter is measured at characterization but not tested.
9.
Tested at +25C.
Test Conditions
Min.
60
60
2.4
Typ.
[5]
115
115
3.3
0.3
Max.
150
150
Unit
mA
mA
V
V
Output LOW Current
[7]
Output HIGH Current
[7]
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V
V
CC
=Min., I
OH
=
24 mA
V
CC
=Min., I
OL
=24 mA
0.55