參數(shù)資料
型號(hào): 74LVC138APWDH
廠商: NXP SEMICONDUCTORS
元件分類(lèi): 通用總線(xiàn)功能
英文描述: 3-to-8 line decoder/demultiplexer; inverting
中文描述: LVC/LCX/Z SERIES, OTHER DECODER/DRIVER, INVERTED OUTPUT, PDSO16
封裝: PLASTIC, TSSOP1-16
文件頁(yè)數(shù): 4/10頁(yè)
文件大?。?/td> 94K
代理商: 74LVC138APWDH
Philips Semiconductors
Product specification
74LVC138A
3-to-8 line decoder/demultiplexer; inverting
1998 Apr 28
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
MIN
MAX
V
CC
DC supply voltage (for max. speed performance)
2.7
3.6
V
DC supply voltage (for low-voltage applications)
1.2
3.6
V
I
DC input voltage range
DC output voltage range; output HIGH or LOW state
DC input voltage range; output 3-State
0
0
0
5.5
V
CC
5.5
V
V
I/O
V
T
amb
Operating free-air temperature range
–40
+85
°
C
t
r
, t
f
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS
1
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0V).
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
I
IK
V
I
I
OK
DC supply voltage
–0.5 to +6.5
V
DC input diode current
V
I
Note 2
0
–50
mA
DC input voltage
–0.5 to +6.5
V
DC output diode current
V
O
Note 2
V
CC
or V
O
0
50
mA
V
I/O
DC output voltage; output HIGH or LOW
–0.5 to V
CC
+0.5
–0.5 to 6.5
V
DC input voltage; output 3-State
Note 2
I
O
DC output source or sink current
V
O
= 0 to V
CC
50
mA
I
GND
, I
CC
T
stg
DC V
CC
or GND current
Storage temperature range
100
mA
–65 to +150
°
C
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
P
TOT
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
500
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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