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參數(shù)資料
| 型號： | 8832I |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | 16-Bit, Ultra-Low Power, Voltage-Output Digital-to-Analog Converter |
| 中文描述： | 16位，超低功耗，電壓輸出數(shù)字模擬轉(zhuǎn)換器 |
| 文件頁數(shù)： | 2/26頁 |
| 文件大?。?/td> | 702K |
| 代理商： | 8832I |
www.ti.com
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
(1)
DAC8832
SBAS380A–FEBRUARY 2006–REVISED APRIL 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION
(1)
MINIMUM
RELATIVE
ACCURACY
(LSB)
POWER-
ON
RESET
VALUE
DIFFERENTIAL
NONLINEARITY
(LSB)
SPECIFIED
TEMPERATURE
RANGE
TRANSPORT
MEDIA,
QUANTITY
PACKAGE
MARKING
PACKAGE-
LEAD
PACKAGE
DESIGNATOR
ORDERING
NUMBER
PRODUCT
DAC8832IRGYT
Tape and Reel, 250
DAC8832IRGY
±
4
±
1
Mid-Code
–40
°
C to +85
°
C
8832I
QFN-14
RGY
DAC8832IRGYR
Tape and Reel, 1000
DAC8832IBRGYT
Tape and Reel, 250
DAC8832IBRGY
±
2
±
1
Mid-Code
–40
°
C to +85
°
C
8832I
QFN-14
RGY
DAC8832IBRGYR
Tape and Reel, 1000
DAC8832ICRGYT
Tape and Reel, 250
DAC8832ICRGY
±
1
±
1
Mid-Code
–40
°
C to +85
°
C
8832I
QFN-14
RGY
DAC8832ICRGYR
Tape and Reel, 1000
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI
website at www.ti.com.
DAC8832
–0.3 to +7
–0.3 to +V
DD
+ 0.3
–0.3 to +V
DD
+ 0.3
–0.3 to +0.3
–40 to +85
–65 to +150
+150
(T
J
max – T
A
) /
θ
JA
54.9
UNIT
V
V
V
V
°
C
°
C
°
C
W
°
C/W
V
DD
to AGND
Digital input voltage to DGND
V
OUT
to AGND
AGND, AGNDF, AGNDS to DGND
Operating temperature range
Storage temperature range
Junction temperature range (T
J
max)
Power dissipation
Thermal impedance,
θ
JA
(1)
Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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