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參數(shù)資料
| 型號(hào)： | 935202220112 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 鎖存器 |
| 英文描述： | ABT SERIES, DUAL POSITIVE EDGE TRIGGERED D FLIP-FLOP, COMPLEMENTARY OUTPUT, PDSO14 |
| 封裝： | 4.40 MM, PLASTIC, MO-153, SOT-402-1, TSSOP1-14 |
| 文件頁數(shù)： | 8/13頁 |
| 文件大?。?/td> | 128K |
| 代理商： | 935202220112 |
Philips Semiconductors
Product data
74ABT5074
Synchronizing dual D-type flip-flop
with metastable immune characteristics
2002 Dec 17
4
METASTABLE IMMUNE CHARACTERISTICS
Philips Semiconductors uses the term ‘metastable immune’ to
describe characteristics of some of the products in its family. By
running two independent signal generators (see Figure 1) at nearly
the same frequency (in this case 10 MHz clock and 10.02 MHz data)
the device-under-test can often be driven into a metastable state. If
the Q output is then used to trigger a digital scope set to infinite
persistence the Q output will build a waveform. An experiment was
run by continuously operating the devices in the region where
metastability will occur.
DQ
Q
CP
TRIGGER
DIGITAL
SCOPE
INPUT
SIGNAL
GENERATOR
SA00004
SIGNAL
GENERATOR
Figure 1.
Test Setup
After determining the T0 and τ of the flop, calculating the mean time
between failures (MTBF) is simple. Suppose a designer wants to
use the 74ABT5074 for synchronizing asynchronous data that is
arriving at 10 MHz (as measured by a frequency counter), has a
clock frequency of 50 MHz, and has decided that he would like to
sample the output of the 74ABT5074 7 nanoseconds after the clock
edge. He simply plugs his number into the following equation:
MTBF = e(t’/τ)/ TO*fC*fI
In this formula, fC is the frequency of the clock, fI is the average
input event frequency, and t’ is the time after the clock pulse that the
output is sampled (t’ > h, h being the normal propagation delay). In
this situation the fI will be twice the data frequency of 20 MHz
because input events consist of both of low and high transitions.
Multiplying fI by fC gives an answer of 1015 Hz2. From Figure 2 it is
clear that the MTBF is greater than 1010 seconds. Using the above
formula the actual MTBF is 1.69
× 1010 seconds or about 535 years.
E6
E8
E10
E12
E14
E15 = fc*fi
E13
E12
E11
E10
E9
E8
E7
E6
E5
10,000 YEARS
100 YEARS
ONE YEAR
ONE WEEK
MTBF
(SECONDS)
t’ (NANOSECONDS)
456
78
MTBF = e(t’/τ)/TO*fC*fI
SA00005
VCC = 5 V, Tamb = 25 °C, τ =94 ps, To = 1.3x107 sec
Figure 2.
Mean Time Between Failures (MTBF) versus t’
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