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參數(shù)資料
| 型號： | 935209560112 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | ALVT SERIES, QUAD 4-BIT DRIVER, TRUE OUTPUT, PDSO48 |
| 封裝： | 7.50 MM, PLASTIC, MO-118AA, SOT-370-1, SSOP3-48 |
| 文件頁數(shù)： | 4/10頁 |
| 文件大?。?/td> | 94K |
| 代理商： | 935209560112 |
Philips Semiconductors
Product specification
74ALVT16244
2.5V/3.3V 16-bit buffer/driver (3-State)
1998 Oct 07
3
PIN CONFIGURATION
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
1OE
1Y0
1Y1
GND
1Y2
1Y3
2Y0
2Y1
GND
2Y2
2Y3
3Y0
3Y1
GND
3Y4
VCC
4Y0
VCC
3Y2
4Y1
GND
4Y3
4OE
4Y2
2OE
1A0
1A1
GND
1A2
1A3
2A0
2A1
GND
2A2
2A3
3A0
3A1
GND
3A3
VCC
4A0
VCC
3A2
4A1
GND
4A3
3OE
4A2
SA00013
PIN DESCRIPTION
PIN NUMBER
SYMBOL
NAME AND FUNCTION
47, 46, 44, 43
41, 40, 38, 37
36, 35, 33, 32
30, 29, 27, 26
1A0 - 1A3,
2A0 - 2A3,
3A0 - 3A3,
4A0 - 4A3
Data inputs
2, 3, 5, 6
8, 9, 11, 12
13, 14, 16, 17
19, 20, 22, 23
1Y0 - 1Y3,
2Y0 - 2Y3,
3Y0 - 3Y3,
4Y0 - 4Y3
Data outputs
1, 48
25, 24
1OE, 2OE,
3OE, 4OE
Output enables
4, 10, 15, 21
28, 34, 39, 45
GND
Ground (0V)
7, 18, 31, 42
VCC
Positive supply voltage
FUNCTION TABLE
INPUTS
OUTPUTS
nOE
nAx
nYx
L
H
X
Z
H = High voltage level
L
= Low voltage level
X = Don’t care
Z = High Impedance “off” state
ABSOLUTE MAXIMUM RATINGS1, 2
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
-0.5 to +4.6
V
IIK
DC input diode current
VI < 0
-50
mA
VI
DC input voltage3
-0.5 to +7.0
V
IOK
DC output diode current
VO < 0
-50
mA
VOUT
DC output voltage3
Output in Off or High state
-0.5 to +7.0
V
IOUT
DC output current
Output in Low state
128
mA
IOUT
DC out ut current
Output in High state
-64
mA
Tstg
Storage temperature range
-65 to +150
°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150
°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
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