參數(shù)資料
型號: AD5722AREZ
廠商: Analog Devices Inc
文件頁數(shù): 8/32頁
文件大小: 0K
描述: IC DAC DUAL 12BIT 1LSB 24TSSOP
產(chǎn)品培訓模塊: Data Converter Fundamentals
DAC Architectures
設(shè)計資源: Software Configurable 12-Bit Dual-Channel Unipolar/Bipolar Voltage Output Using AD5722 (CN0094)
標準包裝: 62
設(shè)置時間: 10µs
位數(shù): 12
數(shù)據(jù)接口: 串行
轉(zhuǎn)換器數(shù)目: 2
電壓電源: 模擬和數(shù)字,雙 ±
功率耗散(最大): 190mW
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 24-TSSOP(0.173",4.40mm)裸露焊盤
供應(yīng)商設(shè)備封裝: 24-TSSOP 裸露焊盤
包裝: 管件
輸出數(shù)目和類型: 2 電壓,單極;2 電壓,雙極
采樣率(每秒): *
產(chǎn)品目錄頁面: 784 (CN2011-ZH PDF)
AD5722/AD5732/AD5752
Rev. D | Page 16 of 32
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy, or integral nonlinearity, is a
measure of the maximum deviation in LSBs from a straight line
passing through the endpoints of the DAC transfer function. A
typical INL vs. code plot can be seen in Figure 6.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot can be seen in Figure 9.
Monotonicity
A DAC is monotonic if the output either increases or remains
constant for increasing digital input code. The AD5722/
AD5732/AD5752 are monotonic over their full operating
temperature range.
Bipolar Zero Error
Bipolar zero error is the deviation of the analog output from the
ideal half-scale output of 0 V when the DAC register is loaded
with 0x8000 (straight binary coding) or 0x0000 (twos complement
coding). A plot of bipolar zero error vs. temperature can be seen
Bipolar Zero TC
Bipolar zero TC is a measure of the change in the bipolar zero
error with a change in temperature. It is expressed in ppm FSR/°C.
Zero-Scale Error or Negative Full-Scale Error
Zero-scale error is the error in the DAC output voltage when
0x0000 (straight binary coding) or 0x8000 (twos complement
coding) is loaded to the DAC register. Ideally, the output voltage
should be negative full-scale 1 LSB. A plot of zero-scale error
vs. temperature can be seen in Figure 22.
Zero-Scale TC
Zero-scale TC is a measure of the change in zero-scale error with a
change in temperature. Zero-scale TC is expressed in ppm FSR/°C.
Output Voltage Settling Time
Output voltage settling time is the amount of time required for
the output to settle to a specified level for a full-scale input change.
A plot for full-scale settling time can be seen in Figure 27.
Slew Rate
The slew rate of a device is a limitation in the rate of change of
the output voltage. The output slewing speed of a voltage output
DAC is usually limited by the slew rate of the amplifier used at
its output. Slew rate is measured from 10% to 90% of the output
signal and is given in V/μs.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal and is expressed in % FSR. A plot of gain error vs.
temperature can be seen in Figure 24.
Gain TC
Gain TC is a measure of the change in gain error with changes
in temperature. Gain TC is expressed in ppm FSR/°C.
Total Unadjusted Error (TUE)
Total unadjusted error is a measure of the output error taking
all the various errors into account, namely INL error, offset
error, gain error, and output drift over supplies, temperature,
and time. TUE is expressed in % FSR.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state, but the output voltage remains constant. It is normally
specified as the area of the glitch in nV-sec and is measured
when the digital input code is changed by 1 LSB at the major
carry transition (0x7FFF to 0x8000). See Figure 31.
Glitch Impulse Peak Amplitude
Glitch impulse peak amplitude is the peak amplitude of the
impulse injected into the analog output when the input code in
the DAC register changes state. It is specified as the amplitude
of the glitch in mV and is measured when the digital input code
is changed by 1 LSB at the major carry transition (0x7FFF to
0x8000). See Figure 31.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC but is measured when the DAC output is not updated. It is
specified in nV-sec and measured with a full-scale code change
on the data bus.
Power Supply Sensitivity
Power supply sensitivity indicates how the output of the DAC is
affected by changes in the power supply voltage. It is measured
by superimposing a 50 Hz/60 Hz, 200 mV p-p sine wave on the
supply voltages and measuring the proportion of the sine wave
that transfers to the outputs.
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