- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄8960 > AD5764BSUZ (Analog Devices Inc)IC DAC 16BIT QUAD VOUT 32-TQFP PDF資料下載
參數(shù)資料
| 型號(hào)： | AD5764BSUZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 9/28頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC DAC 16BIT QUAD VOUT 32-TQFP |
| 產(chǎn)品培訓(xùn)模塊： | Data Converter Fundamentals DAC Architectures |
| 產(chǎn)品變化通告： | AD5764(R), AD5744R Product Change 04/Sept/2009 |
| 設(shè)計(jì)資源： | High Accuracy, Bipolar Voltage Output Digital-to-Analog Conversion Using AD5764 (CN0006) |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 設(shè)置時(shí)間： | 8µs |
| 位數(shù)： | 16 |
| 數(shù)據(jù)接口： | 串行 |
| 轉(zhuǎn)換器數(shù)目： | 4 |
| 電壓電源： | 雙 ± |
| 功率耗散（最大）： | 275 mW |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 32-TQFP |
| 供應(yīng)商設(shè)備封裝： | 32-TQFP（7x7） |
| 包裝： | 托盤 |
| 輸出數(shù)目和類型： | 4 電壓，雙極 |
| 采樣率（每秒）： | 1.26M |
| 產(chǎn)品目錄頁面： | 784 (CN2011-ZH PDF) |
| 配用： | EVAL-AD5764EBZ-ND - BOARD EVAL FOR AD5764 |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁當(dāng)前第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁
Data Sheet
AD5764
Rev. F | Page 17 of 28
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer function. A
typical INL vs. code plot can be seen in Figure 7.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic. A
typical DNL vs. code plot can be seen in Figure 9.
Monotonicity
A DAC is monotonic if the output either increases or remains
constant for increasing digital input code. The AD5764 is
monotonic over its full operating temperature range.
Bipolar Zero Error
Bipolar zero error is the deviation of the analog output from the
ideal half-scale output of 0 V when the data register is loaded
with 0x8000 (offset binary coding) or 0x0000 (twos complement
coding). A plot of bipolar zero error vs. temperature can be seen
in Figure 22.
Bipolar Zero Temperature Coefficient (TC)
Bipolar zero TC is the measure of the change in the bipolar zero
error with a change in temperature. It is expressed in ppm FSR/°C.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code is loaded to the data register. Ideally, the output voltage
should be 2 × VREF 1 LSB. Full-scale error is expressed in
percentage of full-scale range.
Negative Full-Scale Error/Zero-Scale Error
Negative full-scale error is the error in the DAC output voltage
when 0x0000 (offset binary coding) or 0x8000 (twos complement
coding) is loaded to the data register. Ideally, the output voltage
should be 2 × VREF. A plot of zero-scale error vs. temperature
can be seen in Figure 21.
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for the
output to settle to a specified level for a full-scale input change.
Slew Rate
The slew rate of a device is a limitation in the rate of change of
the output voltage. The output slewing speed of a voltage-output
DAC is usually limited by the slew rate of the amplifier used at
its output. Slew rate is measured from 10% to 90% of the output
signal and is given in V/μs.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percentage of the full-scale range. A plot of
gain error vs. temperature can be seen in Figure 23.
Total Unadjusted Error
Total unadjusted error (TUE) is a measure of the output error
considering all the various errors. A plot of total unadjusted
error vs. reference voltage can be seen in Figure 19.
Zero-Scale Error Temperature Coefficient (TC)
Zero-scale error TC is a measure of the change in zero-scale
error with a change in temperature. Zero-scale error TC is
expressed in ppm FSR/°C.
Gain Error Temperature Coefficient (TC)
Gain error TC is a measure of the change in gain error with
changes in temperature. Gain error TC is expressed in
ppm FSR/°C.
Digital-to-Analog Glitch Energy
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the data register changes
state. It is normally specified as the area of the glitch in nV-sec,
and is measured when the digital input code is changed by 1 LSB at
the major carry transition (0x7FFF to 0x8000); see Figure 28.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the DAC
but is measured when the DAC output is not updated. It is speci-
fied in nV-sec and measured with a full-scale code change on
the data bus, that is, from all 0s to all 1s, and vice versa.
Power Supply Sensitivity
Power supply sensitivity indicates how the output of the DAC is
affected by changes in the power supply voltage.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is measured
with a full-scale output change on one DAC while monitoring
another DAC, and is expressed in LSBs.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse transferred to the
output of one DAC due to a digital code change and subsequent
output change of another DAC. This includes both digital and
analog crosstalk. It is measured by loading one of the DACs with
a full-scale code change (all 0s to all 1s and vice versa) with LDAC
low and monitoring the output of another DAC. The energy of
the glitch is expressed in nV-sec.
Channel-to-Channel Isolation
Channel-to-channel isolation is the ratio of the amplitude of the
signal at the output of one DAC to a sine wave on the reference
input of another DAC. It is measured in dB.
Digital Crosstalk
Digital crosstalk is a measure of the impulse injected into the
analog output of one DAC from the digital inputs of another DAC,
but is measured when the DAC output is not updated. It is specified
in nV-sec and measured with a full-scale code change on the data
bus, that is, from all 0s to all 1s, and vice versa.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| VE-J53-MZ-F4 | CONVERTER MOD DC/DC 24V 25W |
| AD7568BSZ | IC DAC 12BIT OCTAL LC2MOS 44MQFP |
| VI-B4Z-MU-F2 | CONVERTER MOD DC/DC 2V 80W |
| D38999/20KG41PB | CONN RCPT 41POS WALL MNT W/PINS |
| VI-B4Y-MU-F4 | CONVERTER MOD DC/DC 3.3V 132W |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| AD5764BSUZ-REEL7 | 功能描述:IC DAC 16BIT QUAD VOUT 32-TQFP RoHS:是 類別:集成電路 (IC) >> 數(shù)據(jù)采集 - 數(shù)模轉(zhuǎn)換器 系列:- 產(chǎn)品培訓(xùn)模塊:Data Converter Fundamentals DAC Architectures 標(biāo)準(zhǔn)包裝:750 系列:- 設(shè)置時(shí)間:7µs 位數(shù):16 數(shù)據(jù)接口:并聯(lián) 轉(zhuǎn)換器數(shù)目:1 電壓電源:雙 ± 功率耗散（最大）:100mW 工作溫度:0°C ~ 70°C 安裝類型:表面貼裝 封裝/外殼:28-LCC（J 形引線） 供應(yīng)商設(shè)備封裝:28-PLCC（11.51x11.51） 包裝:帶卷 (TR) 輸出數(shù)目和類型:1 電壓，單極；1 電壓，雙極 采樣率（每秒）:143k |
| AD5764CSU | 制造商:Analog Devices 功能描述: |
| AD5764CSUZ | 功能描述:IC DAC 16BIT QUAD VOUT 32TQFP RoHS:是 類別:集成電路 (IC) >> 數(shù)據(jù)采集 - 數(shù)模轉(zhuǎn)換器 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:1,000 系列:- 設(shè)置時(shí)間:1µs 位數(shù):8 數(shù)據(jù)接口:串行 轉(zhuǎn)換器數(shù)目:8 電壓電源:雙 ± 功率耗散（最大）:941mW 工作溫度:0°C ~ 70°C 安裝類型:表面貼裝 封裝/外殼:24-SOIC（0.295"，7.50mm 寬） 供應(yīng)商設(shè)備封裝:24-SOIC W 包裝:帶卷 (TR) 輸出數(shù)目和類型:8 電壓，單極 采樣率（每秒）:* |
| AD5764CSUZ-REEL7 | 功能描述:IC DAC 16BIT QUAD BIPO 32-TQFP RoHS:是 類別:集成電路 (IC) >> 數(shù)據(jù)采集 - 數(shù)模轉(zhuǎn)換器 系列:- 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:1,000 系列:- 設(shè)置時(shí)間:1µs 位數(shù):8 數(shù)據(jù)接口:串行 轉(zhuǎn)換器數(shù)目:8 電壓電源:雙 ± 功率耗散（最大）:941mW 工作溫度:0°C ~ 70°C 安裝類型:表面貼裝 封裝/外殼:24-SOIC（0.295"，7.50mm 寬） 供應(yīng)商設(shè)備封裝:24-SOIC W 包裝:帶卷 (TR) 輸出數(shù)目和類型:8 電壓，單極 采樣率（每秒）:* |
| AD5764R | 制造商:AD 制造商全稱:Analog Devices 功能描述:Complete Quad, 16-Bit, High Accuracy, Serial Input, Bipolar Voltage Output DAC |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。