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參數(shù)資料
| 型號： | AD9481-PCBZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 27/28頁 |
| 文件大?。?/td> | 0K |
| 描述： | BOARD EVAL 8BIT 250MSPS 44-TQFP |
| 標(biāo)準(zhǔn)包裝： | 1 |
| ADC 的數(shù)量： | 1 |
| 位數(shù)： | 8 |
| 采樣率（每秒）： | 250M |
| 數(shù)據(jù)接口： | 并聯(lián) |
| 輸入范圍： | 1 Vpp |
| 在以下條件下的電源（標(biāo)準(zhǔn)）： | 439mW @ 250MSPS |
| 工作溫度： | -40°C ~ 85°C |
| 已用 IC / 零件： | AD9481 |
| 已供物品： | 板 |
| 相關(guān)產(chǎn)品： | AD9481BSUZ-250-ND - IC ADC 8BIT 250MSPS 3.3V 44-TQFP |
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AD9481
Rev. 0 | Page 8 of 28
ABSOLUTE MAXIMUM RATINGS
Thermal impedance (θJA) = 46.4°C/W (4-layer PCB).
Table 5.
Parameter
Min.
Rating
Max.
Rating
ELECTRICAL
AVDD (With respect to AGND)
0.5 V
+4.0 V
DRVDD
(With respect to DRGND)
0.5 V
+4.0 V
AGND (With respect to DRGND)
0.5 V
+0.5 V
Digital I/0
(With respect to DRGND)
0.5 V
DRVDD + 0.5 V
Analog Inputs
(With respect to AGND)
0.5 V
AVDD + 0.5 V
ENVIRONMENTAL
Operating Temperature
40°C
+85°C
Junction Temperature
150°C
Storage Temperature
150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
EXPLANATION OF TEST LEVELS
Table 6.
Level
Description
I
100% production tested.
II
100% production tested at 25°C and guaranteed by
design and characterization at specified temperatures.
III
Sample tested only.
IV
Parameter is guaranteed by design and characterization
testing.
V
Parameter is a typical value only.
VI
100% production tested at 25°C and guaranteed by
design and characterization for industrial temperature
range.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate
on the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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