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參數(shù)資料
| 型號(hào)： | ADC0800 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | ECONOLINE: REC3-S_DRW(Z)/H* - 3W DIP Package- 1kVDC Isolation- Wide Input 2:1 & 4:1- Regulated Output- 100% Burned In- UL94V-0 Package Material- Continuous Short Circiut Protection- Efficiency to 80% |
| 中文描述： | ADC0800 8位A / D轉(zhuǎn)換器 |
| 文件頁(yè)數(shù)： | 9/10頁(yè) |
| 文件大?。?/td> | 166K |
| 代理商： | ADC0800 |
Typical Applications
(Continued)
A low speed ramp generator can also be used to sweep the
analog input voltage and the LED outputs will provide a bi-
nary counting sequence from zero to full-scale.
The techniques described so far are suitable for an engi-
neering evaluation or a quick check on performance. For a
higher speed test system, or to obtain plotted data, a digital-
to-analog converter is needed for the test set-up. An accu-
rate 10-bit DAC can serve as the precision voltage source
for the A/D. Errors of the A/D under test can be provided as
either analog voltages or differences in two digital words.
A basic A/D tester which uses a DAC and provides the error
as an analog output voltage is shown in Figure 6. The 2 op
amps can be eliminated if a lab DVM with a numerical sub-
traction feature is available to directly readout the difference
voltage, ‘‘A–C’’.
For operation with a microprocessor or a computer-based
test system, it is more convenient to present the errors digi-
tally. This can be done with the circuit ofFigure 7 where the
output code transitions can be detected as the 10-bit DAC is
incremented. This provides
(/4
LSB steps for the 8-bit A/D
under test. If the results of this test are automatically plotted
with the analog input on the X axis and the error (in LSB’s)
as the Y axis, a useful transfer function of the A/D under
test results. For acceptance testing, the plot is not neces-
sary and the testing speed can be increased by establishing
internal limits on the allowed error for each code.
All R’s
e
0.05% tolerance
TL/H/5670–16
FIGURE 6. A/D Tester with Analog Error Output
TL/H/5670–17
FIGURE 7. Basic ‘‘Digital’’ A/D Tester
Connection Diagram
Dual-In-Line Package
TL/H/5670–9
Top View
Order Number ADC0800PD
or ADC0800PCD
See NS Package Number D18A
9
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| ADC08031 | 8-Bit High-Speed Serial I/O A/D Converters with Multiplexer Options, <BR> Voltage Reference, and Track/Hold Function |
| ADC08031CIN | 8-Bit High-Speed Serial I/O A/D Converters with Multiplexer Options, <BR> Voltage Reference, and Track/Hold Function |
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| ADC08038 | 8-Bit High-Speed Serial I/O A/D Converters with Multiplexer Options, Voltage Reference, and Track/Hold Function(8位高速串行輸入/輸出A/D轉(zhuǎn)換器帶多路選擇，電壓基準(zhǔn)和跟蹤/保持功能) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| ADC08004-1CD | 制造商:PHILIPS 制造商全稱(chēng):NXP Semiconductors 功能描述:CMOS 8-bit A/D converters |
| ADC08004-1CN | 制造商:PHILIPS 制造商全稱(chēng):NXP Semiconductors 功能描述:CMOS 8-bit A/D converters |
| ADC08004-1LCD | 制造商:PHILIPS 制造商全稱(chēng):NXP Semiconductors 功能描述:CMOS 8-bit A/D converters |
| ADC08004-1LCN | 制造商:PHILIPS 制造商全稱(chēng):NXP Semiconductors 功能描述:CMOS 8-bit A/D converters |
| ADC0800PCD | 制造商:NSC 制造商全稱(chēng):National Semiconductor 功能描述:ADC0800 8-Bit A/D Converter |
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