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參數(shù)資料
| 型號： | ADL5317ACPZ-REEL7 |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 7/16頁 |
| 文件大?。?/td> | 541K |
| 描述： | IC CURRENT MONITOR 16LFCSP |
| 設計資源： | Interfacing ADL5317 High Side Current Mirror to a Translinear Logarithmic Amplifier in an Avalanche Photodiode Power Detector |
| 標準包裝： | 1 |
| 功能： | 電流監(jiān)控器 |
| 檢測方法： | 高端 |
| 輸入電壓： | 10 V ~ 80 V |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 16-VFQFN 裸露焊盤，CSP |
| 供應商設備封裝： | 16-LFCSP-VQ |
| 包裝： | 標準包裝 |
| 產品目錄頁面： | 772 (CN2011-ZH PDF) |
| 其它名稱： | ADL5317ACPZ-REEL7DKR |
ADL5317
Rev. 0 | Page 7 of 16
3
3
1n
10m
I
APD
(Amperes)
10n
100n
1?/SPAN> 10?/SPAN>
100?/SPAN>
1m
2
1
0
1
2
+85?/SPAN>C
+25?/SPAN>C
40?/SPAN>C
Figure 9. IPDM Linearity for Multiple Temperatures and Devices
VPHV =75 V, VAPD = 60 V, Normalized to IAPD = 5 糀, 25癈
100pA
1fA
1k
10M
FREQUENCY (Hz)
10k
100k
1M
10pA
1pA
100fA
10fA
500?/SPAN>A
500nA
5mA
50nA
5nA
5?/SPAN>A
50?/SPAN>A
Figure 10. Output Current Noise Density vs. Frequency for
Multiple Values of I
APD
, C
GARD
= 2 nF, V
PHV
= 40 V, V
APD
= 30 V
TEMPERATURE (?/SPAN>C)
40
30
20
10
0
10
20
30
40
90
30 20 10 0 10 20 30 40 50 60 70 80
+3 SIGMA
3 SIGMA
AVERAGE
Figure 11. Temperature Drift of V
APD
, 3 ?to Either Side of Mean
3
3
1n
10m
I
APD
(Amperes)
10n
100n
1?/SPAN>
10?/SPAN>
100?/SPAN>
1m
2
1
0
1
2
+85?/SPAN>C
+25?/SPAN>C
40?/SPAN>C
Figure 12. IPDM Linearity for Multiple Temperatures and Devices
VPHV = 45 V, VAPD = 32 V, Normalized to IAPD = 5 糀, 25癈
4.5
0
1n
1m
I
PDM
(Amperes)
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
10n
100n
1?/SPAN>
10?/SPAN>
100?/SPAN>
Figure 13. Output Wideband Current Noise as a Percentage of I
PDM
vs. I
PDM
,
C
GARD
= 2 nF, V
PHV
= 40 V, V
APD
= 30 V, BW = 10 MHz
10
30
FREQUENCY (Hz)
5
0
5
10
15
20
25
100M
10
100
1k
10k
100k
1M
10M
50?/SPAN>A
5nA
50nA
500nA
5?/SPAN>A
Figure 14. Small Signal AC Response from IAPD to IPDM, for IAPD in
Decades from 5 nA to 50 糀, VPHV = 60 V, VAPD = 30 V
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