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| 型號： | ADT7517ARQ-REEL7 |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 溫度/濕度傳感器 |
| 英文描述： | SPI/I2C Compatible, Temperature Sensor, Four Channel ADC and Quad Voltage Output DAC |
| 中文描述： | DIGITAL TEMP SENSOR-SERIAL, 10BIT(s), 4Cel, RECTANGULAR, SURFACE MOUNT |
| 封裝： | MO-137AB, QSOP-16 |
| 文件頁數(shù)： | 26/44頁 |
| 文件大?。?/td> | 1350K |
| 代理商： | ADT7517ARQ-REEL7 |
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ADT7516/ADT7517/ADT7519
Table 8. V
DD
Data Format (V
REF
= 2.28 V)
V
DD
Value (V)
2.7
3
3.5
4
4.5
5
5.5
6
6.5
7
On-Chip Reference
The ADT7516/ADT7517/ADT7519 have an on-chip 1.2 V band
gap reference, which is gained up by a switched capacitor ampli-
fier to give an output of 2.28 V. The amplifier is powered up for
the duration of the device monitoring phase and is powered
down once monitoring is disabled. This saves on current con-
sumption. The internal reference is used as the reference for the
ADC. The ADC is used for measuring V
DD
, internal temperature
sensor, external temperature sensor, and AIN inputs. The
internal reference is always used when measuring V
DD
, and the
internal and external temperature sensors. The external
reference is the default power-up reference for the DACs.
Round Robin Measurement
On power-up, the ADT7516/ADT7517/ADT7519 go into round
robin mode but monitoring is disabled. Setting Bit C0 of the
Configuration Register 1 to 1 enables conversions. It sequences
through all the available channels, taking a measurement from
each in the following order: V
DD
, internal temperature sensor,
external temperature sensor/(AIN1 and AIN2), AIN3, and
AIN4. Pin 7 and Pin 8 can be configured to be either external
temperature sensor pins or standalone analog input pins. Once
conversion is completed on the AIN4 channel, the device loops
around for another measurement cycle. This method of taking a
measurement on all the channels in one cycle is called round
robin. Setting Bit C4 of Control Configuration 2 (Address 19h)
disables the round robin mode and in turn sets up the single-
channel mode. The single-channel mode is where only one
channel, e.g., internal temperature sensor, is measured in each
conversion cycle.
Rev. A | Page 26 of 44
Digital Output
Binary
01 1000 1011
01 1011 0111
10 0000 0000
10 0100 1001
10 1001 0010
10 1101 1100
11 0010 0101
11 0110 1110
11 1011 0111
11 1111 1111
Hex
18B
1B7
200
249
292
2DC
325
36E
3B7
3FF
The time taken to monitor all channels will normally not be of
interest, since the most recently measured value can be read at
any time. For applications where the round robin time is impor-
tant, typical times at 25°C are given in the specifications.
Single-Channel Measurement
Setting C4 of the Control Configuration 2 register enables the
single-channel mode and allows the ADT7516/ADT7517/
ADT7519 to focus on one channel only. A channel is selected by
writing to Bits C0:C2 in the Control Configuration 2 register.
For example, to select the V
DD
channel for monitoring, write to
the Control Configuration 2 register and set C4 to 1 (if not
done so already), then write all 0s to Bits C0:C2. All subsequent
conversions will be done on the V
DD
channel only. To change the
channel selection to the internal temperature channel, write to
the Control Configuration 2 register and set C0 = 1. When
measuring in single-channel mode, conversions on the channel
selected occur directly after each other. Any communication to
the ADT7516/ADT7517/ADT7519 stops the conversions, but
they are restarted once the read or write operation is completed.
Temperature Measurement Method
Internal Temperature Measurement
The ADT7516/ADT7517/ADT7519 contain an on-chip band
gap temperature sensor whose output is digitized by the on-chip
ADC. The temperature data is stored in the Internal Temper-
ature Value register. Because both positive and negative temper-
atures can be measured, the temperature data is stored in twos
complement format, as shown in Table 9. The thermal charac-
teristics of the measurement sensor could change and, therefore,
an offset is added to the measured value to enable the transfer
function to match the thermal characteristics. This offset is
added before the temperature data is stored. The offset value
used is stored in the internal temperature offset register.
External Temperature Measurement
The ADT7516/ADT7517/ADT7519 can measure the temper-
ature of one external diode sensor or diode-connected
transistor.
The forward voltage of a diode or diode-connected transistor,
operated at a constant current, exhibits a negative temperature
coefficient of about –2 mV/°C. Unfortunately, because the
absolute value of V
BE
varies from device to device, and indivi-
dual calibration is required to null this out, the technique is
unsuitable for mass production.
The technique used in the ADT7516/ADT7517/ADT7519 is to
measure the change in V
BE
when the device is operated at two
different currents. This is given by
( )
n
1
q
KT
V
BE
/
×
=
where:
K
is Boltzmann’s constant.
q
is the charge on the carrier.
T
is the absolute temperature in kelvins.
N
is the ratio of the two currents.
Figure 45 shows the input signal conditioning used to measure
the output of an external temperature sensor. This figure shows
the external sensor as a substrate transistor, provided for temp-
erature monitoring on some microprocessors, but it could
equally well be a discrete transistor.
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