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參數(shù)資料
| 型號： | ADT7518ARQZ |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 溫度/濕度傳感器 |
| 英文描述： | SPI/I2C Compatible, Temperature Sensor, 4-Channel ADC and Quad Voltage Output DAC |
| 中文描述： | DIGITAL TEMP SENSOR-SERIAL, 10BIT(s), 5Cel, RECTANGULAR, SURFACE MOUNT |
| 封裝： | LEAD FREE, MO-137-AB, QSOP-16 |
| 文件頁數(shù)： | 5/40頁 |
| 文件大小： | 1217K |
| 代理商： | ADT7518ARQZ |
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ADT7518
Parameter
1
DIGITAL OUTPUT
Digital High Voltage, V
OH
Output Low Voltage, V
OL
Output High Current, I
OH
Output Capacitance, C
OUT
INT/INT Output Saturation Voltage
I
2
C TIMING CHARACTERISTICS
8,
9
Serial Clock Period, t
1
Data In Setup Time to SCL High, t
2
Data Out Stable after SCL Low, t
3
SDA Low Setup Time to SCL
Low (Start Condition), t
4
SDA High Hold Time after SCL
High (Stop Condition), t
5
SDA and SCL Fall Time, t
6
SPI TIMING CHARACTERISTICS
4,
10
CS to SCLK Setup Time, t
1
SCLK High Pulse Width, t
2
SCLK Low Pulse Width, t
3
Data Access Time after SCLK
Falling Edge, t
4
11
Data Setup Time Prior to SCLK
Rising Edge, t
5
Data Hold Time after SCLK Rising
Edge, t
6
CS to SCLK Hold Time, t
7
CS to DOUT High Impedance, t
8
POWER REQUIREMENTS
V
DD
V
DD
Settling Time
I
DD
(Normal Mode)
12
I
DD
(Power-Down Mode)
Power Dissipation
Rev. A | Page 5 of 40
Min
2.4
Typ
Max
0.4
1
50
0.8
Unit
V
V
mA
pF
V
μs
ns
ns
ns
Conditions/Comments
I
SOURCE
= I
SINK
= 200 μA.
I
OL
= 3 mA.
V
OH
= 5 V.
I
OUT
= 4 mA.
Fast Mode I
2
C. See Figure 2.
See Figure 2.
See Figure 2.
2.5
50
0
50
50
ns
See Figure 2.
0
50
50
90
35
ns
ns
ns
ns
ns
See Figure 2.
See Figure 3.
See Figure 3.
See Figure 3.
20
ns
See Figure 3.
0
ns
See Figure 3.
0
2.7
2.2
40
5.5
50
3
3
10
10
10
33
μs
ns
V
ms
mA
mA
μA
μA
mW
μW
See Figure 3.
See Figure 3.
V
DD
settles to within 10% of its final voltage level.
V
DD
= 3.3 V, V
IH
= V
DD
, and V
IL
= GND.
V
DD
= 5 V, V
IH
= V
DD
, and V
IL
= GND.
V
DD
= 3.3 V, V
IH
= V
DD
, and V
IL
= GND.
V
DD
= 5 V, V
IH
= V
DD
, and V
IL
= GND.
V
DD
= 3.3 V. Normal mode.
V
DD
= 3.3 V. Shutdown mode.
1
See the
2
DC specifications are tested with the outputs unloaded.
3
Linearity is tested using a reduced code range: ADT7518 (Code 8 to 255).
4
Guaranteed by design and characterization, not production tested.
5
Round robin is the continuous sequential measurement of the following channels: V
DD
, internal temperature, external temperature (AIN1, AIN2), AIN3, and AIN4.
6
The temperature accuracy specifications are valid when the internal reference is not being used by the on-chip DAC. For new designs, the ADT7519 is recommended
as it does not have this limitation.
7
For the amplifier output to reach its minimum voltage, the offset error must be negative. For the amplifier output to reach its maximum voltage (V
REF
= V
DD
), the offset
plus gain error must be positive.
8
The SDA and SCL timing is measured with the input filters turned on to meet the fast-mode I
2
C specification. Switching off the input filters improves the transfer rate
but has a negative effect on the EMC behavior of the part.
9
Guaranteed by design, not production tested.
10
All input signals are specified with tr = tf = 5 ns (10% to 90% of V
DD
), and timed from a voltage level of 1.6 V.
11
Measured with the load circuit shown in Figure 4.
12
The I
DD
specification is valid for all DAC codes and full-scale analog input voltages. Interface inactive. All DACs and ADCs active. Load currents excluded.
section.
Terminology
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