2-26 Revision 16 The length of time an I/O can withstand IOSH/IOSL events depends on the junction temp" />
參數(shù)資料
型號(hào)： AGLP060V2-CSG289
廠商： Microsemi SoC
文件頁數(shù)： 70/134頁
文件大?。?/td> 0K
描述： IC FPGA IGLOO PLUS 60K 289-CSP
標(biāo)準(zhǔn)包裝： 152
系列： IGLOO PLUS
邏輯元件/單元數(shù)： 1584
RAM 位總計(jì)： 18432
輸入/輸出數(shù)： 157
門數(shù)： 60000
電源電壓： 1.14 V ~ 1.575 V
安裝類型： 表面貼裝
工作溫度： 0°C ~ 70°C
封裝/外殼： 289-TFBGA，CSBGA
供應(yīng)商設(shè)備封裝： 289-CSP（14x14）
IGLOO PLUS DC and Switching Characteristics
2-26
Revision 16
The length of time an I/O can withstand IOSH/IOSL events depends on the junction temperature. The
reliability data below is based on a 3.3 V, 12 mA I/O setting, which is the worst case for this type of
analysis.
For example, at 100°C, the short current condition would have to be sustained for more than six months
to cause a reliability concern. The I/O design does not contain any short circuit protection, but such
protection would only be needed in extremely prolonged stress conditions.
Table 2-31 Duration of Short Circuit Event before Failure
Temperature
Time before Failure
–40°C
> 20 years
0°C
> 20 years
25°C
> 20 years
70°C
5 years
85°C
2 years
100°C
6 months
Table 2-32 Schmitt Trigger Input Hysteresis
Hysteresis Voltage Value (Typ.) for Schmitt Mode Input Buffers
Input Buffer Configuration
Hysteresis Value (typ.)
3.3 V LVTTL/LVCMOS (Schmitt trigger mode)
240 mV
2.5 V LVCMOS (Schmitt trigger mode)
140 mV
1.8 V LVCMOS (Schmitt trigger mode)
80 mV
1.5 V LVCMOS (Schmitt trigger mode)
60 mV
1.2 V LVCMOS (Schmitt trigger mode)
40 mV
Table 2-33 I/O Input Rise Time, Fall Time, and Related I/O Reliability
Input Buffer
Input Rise/Fall
Time (min.)
Input Rise/Fall Time
(max.)
Reliability
LVTTL/LVCMOS (Schmitt trigger
disabled)
No requirement
10 ns *
20 years (100°C)
LVTTL/LVCMOS (Schmitt trigger
enabled)
No requirement
No requirement, but
input noise voltage
cannot exceed Schmitt
hysteresis.
20 years (100°C)
Note: *The maximum input rise/fall time is related to the noise induced into the input buffer trace. If the
noise is low, then the rise time and fall time of input buffers can be increased beyond the
maximum value. The longer the rise/fall times, the more susceptible the input signal is to the board
noise. Microsemi recommends signal integrity evaluation/characterization of the system to ensure
that there is no excessive noise coupling into input signals.
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AGLP060-V2CSG289ES 制造商:ACTEL 制造商全稱:Actel Corporation 功能描述:IGLOO PLUS Low-Power Flash FPGAs with FlashFreeze Technology
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AGLP060V2-CSG289I 功能描述:IC FPGA IGLOO PLUS 60K 289-CSP RoHS:是 類別:集成電路 (IC) >> 嵌入式 - FPGA（現(xiàn)場(chǎng)可編程門陣列） 系列:IGLOO PLUS 標(biāo)準(zhǔn)包裝:90 系列:ProASIC3 LAB/CLB數(shù):- 邏輯元件/單元數(shù):- RAM 位總計(jì):36864 輸入/輸出數(shù):157 門數(shù):250000 電源電壓:1.425 V ~ 1.575 V 安裝類型:表面貼裝 工作溫度:-40°C ~ 125°C 封裝/外殼:256-LBGA 供應(yīng)商設(shè)備封裝:256-FPBGA（17x17）
AGLP060-V2CSG289PP 制造商:ACTEL 制造商全稱:Actel Corporation 功能描述:IGLOO PLUS Low-Power Flash FPGAs with FlashFreeze Technology
AGLP060-V2FCS289 制造商:ACTEL 制造商全稱:Actel Corporation 功能描述:IGLOO PLUS Low-Power Flash FPGAs with FlashFreeze Technology
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