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參數(shù)資料
| 型號： | AM29N323D |
| 廠商： | Advanced Micro Devices, Inc. |
| 英文描述： | 32 Megabit (2 M x 16-Bit) CMOS 1.8 Volt-only Simultaneous Read/Write, Burst Mode Flash Memory |
| 中文描述： | 32兆位（2米× 16位）的CMOS 1.8伏，只有同時讀/寫，突發(fā)模式閃存 |
| 文件頁數(shù)： | 3/48頁 |
| 文件大小： | 824K |
| 代理商： | AM29N323D |
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Am29N323D
August 8, 2002
GENERAL DESCRIPTION
The Am29N323 is a 32 Mbit, 1.8 Volt-only, simulta-
neous Read/Write, Burst Mode Flash memory device,
organized as 2,097,152 words of 16 bits each. This
device uses a single V
CC
of 1.7 to 1.9 V to read, pro-
gram, and erase the memory array. A 12.0-volt V
PP
may be used for faster program performance if desired.
The device can also be programmed in standard
EPROM programmers.
The Am29N323 provides a burst access of 20 ns at 30
pF with initial access times of 120 ns at 30 pF. The
device operates within the industrial temperature range
of –25
°
C to +85
°
C. The device is offered in the 47-ball
FBGA package.
Simultaneous Read/Write Operations with
Zero Latency
The Simultaneous Read/Write architecture provides
simultaneous operation
by dividing the memory
space into two banks. The device can improve overall
system performance by allowing a host system to pro-
gram or erase in one bank, then immediately and si-
multaneously read from the other bank, with zero
latency. This releases the system from waiting for the
completion of program or erase operations.
The device is divided as shown in the following table:
The device uses Chip Enable (CE#), Write Enable
(WE#), Address Valid (AVD#) and Output Enable
(OE#) to control asynchronous read and write opera-
tions. For burst operations, the device additionally
requires Power Saving (PS), Ready (RDY), and Clock
(CLK). This implementation allows easy interface with
minimal glue logic to microprocessors/microcontrollers
for high performance read operations.
The device offers complete compatibility with the
JEDEC 42.4 single-power-supply Flash command
set standard
. Commands are written to the command
register using standard microprocessor write timings.
Reading data out of the device is similar to reading
from other Flash or EPROM devices.
The host system can detect whether a program or
erase operation is complete by using the device
sta-
tus bit
DQ7 (Data# Polling) and DQ6/DQ2 (toggle
bits). After a program or erase cycle has been com-
pleted, the device automatically returns to reading
array data.
The
sector erase architecture
allows memory sec-
tors to be erased and reprogrammed without affecting
the data contents of other sectors. The device is fully
erased when shipped from the factory.
Hardware data protection
measures include a low
V
CC
detector that automatically inhibits write opera-
tions during power transitions. The device also offers
three types of data protection at the sector level. The
sector lock/unlock command sequence
disables or
re-enables both program and erase operations in any
sector. When at V
IL
,
WP#
locks the two outermost sec-
tors. Finally, when
V
PP
is at V
IL
, all sectors are locked.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the
automatic sleep mode
.
The system can also place the device into the
standby mode
. Power consumption is greatly re-
duced in both modes.
Bank A Sectors
Bank B Sectors
Quantity
Size
Quantity
Size
8
4 Kwords
48
32 Kwords
15
32 Kwords
8 Mbits total
24 Mbits total
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