參數(shù)資料
型號(hào): AND8090
廠商: ON SEMICONDUCTOR
英文描述: AC Characteristics of ECL Devices
中文描述: 交流特性的ECL裝置
文件頁(yè)數(shù): 2/20頁(yè)
文件大小: 896K
代理商: AND8090
AND8090/D
http://onsemi.com
2
LAB TESTING
Test Bench Overview
Specialized test benches are used to determine the AC
characteristics of the DeviceUnderTest (DUT). A typical
test bench setup for a differential device is shown in
Figure 1.
Test Initialization
The test cables are connected from the pulse generator to
the appropriate DUT test board input connectors.
The test cables are connected from the DUT test board
output connectors to the appropriate digital sampling
oscilloscope input connectors.
The power supply cables are connected to the DUT test
board power supply connectors.
The airflow regulator is set to 500 lfpm and the desired
DUT ambient air temperature. The DUT is in this
environment for a minimum of 3 minutes before testing
begins. Data sheet specifications are typically given for
40
°
C, 25
°
C, and 85
°
C.
Q
CHANNEL A (50
CHANNEL B (50
Q
TRIGGER
CHANNEL C (50
CHANNEL D (50
TRIGGER
PULSE
GENERATOR
OSCILLOSCOPE
V
CC
D
D
Q
Q
50 COAX
V
EE
50 COAX
50 COAX
50 COAX
50 COAX
50 COAX
Figure 1. AC Characterization Test Bench Setup
Test Board
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相關(guān)代理商/技術(shù)參數(shù)
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AND8090D 制造商:ONSEMI 制造商全稱(chēng):ON Semiconductor 功能描述:AC Characteristics of ECL Devices
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