參數(shù)資料
型號(hào): APT6010B2FLLG
廠商: MICROSEMI CORP
元件分類: JFETs
英文描述: 54 A, 600 V, 0.1 ohm, N-CHANNEL, Si, POWER, MOSFET
封裝: T-MAX, 3 PIN
文件頁數(shù): 2/5頁
文件大?。?/td> 261K
代理商: APT6010B2FLLG
050-7062
Rev
D
6-2006
DYNAMIC CHARACTERISTICS
APT6010B2_LFLL
Note:
Duty Factor D = t1/t2
Peak TJ = PDM x ZθJC + TC
t1
t2
P
DM
SINGLE PULSE
Z θ
JC
,THERMAL
IMPEDANCE
(°C/W)
10-5
10-4
10-3
10-2
10-1
1.0
RECTANGULARPULSEDURATION(SECONDS)
FIGURE1,MAXIMUMEFFECTIVETRANSIENTTHERMALIMPEDANCE,JUNCTION-TO-CASEvsPULSEDURATION
0.20
0.16
0.12
0.08
0.04
0
0.5
0.1
0.3
0.7
D = 0.9
0.05
SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS
THERMALCHARACTERISTICS
Characteristic / Test Conditions
Continuous Source Current (Body Diode)
Pulsed Source Current 1 (Body Diode)
Diode Forward Voltage 2 (VGS = 0V, IS = -54A)
Peak Diode Recovery dv/dt 5
Reverse Recovery Time
(IS = -54A, di/dt = 100A/s)
Reverse Recovery Charge
(IS = -54A, di/dt = 100A/s)
Peak Recovery Current
(IS = -54A, di/dt = 100A/s)
Symbol
IS
ISM
VSD
dv/dt
trr
Qrr
IRRM
UNIT
Amps
Volts
V/ns
ns
C
Amps
MIN
TYP
MAX
54
216
1.3
15
Tj = 25°C
300
Tj = 125°C
600
Tj = 25°C
2.7
Tj = 125°C
7.8
Tj = 25°C
14
Tj = 125°C
20
Symbol
RθJC
RθJA
MIN
TYP
MAX
0.18
40
UNIT
°C/W
Characteristic
Junction to Case
Junction to Ambient
Symbol
C
iss
C
oss
C
rss
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
E
on
E
off
E
on
E
off
Characteristic
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge 3
Gate-Source Charge
Gate-Drain ("Miller") Charge
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Turn-on Switching Energy 6
Turn-off Switching Energy
Turn-on Switching Energy 6
Turn-off Switching Energy
Test Conditions
V
GS = 0V
V
DS = 25V
f = 1 MHz
V
GS = 10V
V
DD = 300V
I
D = 54A @ 25°C
RESISTIVESWITCHING
V
GS = 15V
V
DD = 300V
I
D = 54A@ 25°C
R
G = 0.6
INDUCTIVE SWITCHING @ 25°C
V
DD = 400V, VGS = 15V
I
D = 54A, RG = 5
INDUCTIVE SWITCHING @ 125°C
V
DD = 400V VGS = 15V
I
D = 54A, RG = 5
MIN
TYP
MAX
6710
1250
90
150
30
75
12
19
34
9
885
970
1150
1220
UNIT
pF
nC
ns
J
1 Repetitive Rating: Pulse width limited by maximum junction
temperature
2 Pulse Test: Pulse width < 380 s, Duty Cycle < 2%
3 See MIL-STD-750 Method 3471
4 Starting Tj = +25°C, L = 2.06mH, RG = 25, Peak IL = 54A
5 dv
/dt numbers reflect the limitations of the test circuit rather than the
device itself. I
S -ID54A
di/dt ≤ 700A/s V
R ≤ 600V
T
J ≤ 150°C
6 Eon includes diode reverse recovery. See figures 18, 20.
Microsemi reserves the right to change, without notice, the specifications and inforation contained herein.
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