參數(shù)資料
型號(hào): AT91SAM7S32B-MU
廠商: Atmel
文件頁數(shù): 108/165頁
文件大?。?/td> 0K
描述: IC MCU ARM7 32KB FLASH 48-VQFN
產(chǎn)品培訓(xùn)模塊: MCU Product Line Introduction
標(biāo)準(zhǔn)包裝: 250
系列: SAM7S
核心處理器: ARM7
芯體尺寸: 16/32-位
速度: 55MHz
連通性: I²C,SPI,SSC,UART/USART
外圍設(shè)備: 欠壓檢測(cè)/復(fù)位,DMA,POR,PWM,WDT
輸入/輸出數(shù): 21
程序存儲(chǔ)器容量: 32KB(32K x 8)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 8K x 8
電壓 - 電源 (Vcc/Vdd): 1.65 V ~ 1.95 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 8x10b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 85°C
封裝/外殼: 48-VFQFN 裸露焊盤
包裝: 托盤
配用: AT91SAM-ICE-ND - EMULATOR FOR AT91 ARM7/ARM9
AT91SAM7S-EK-ND - KIT EVAL FOR ARM AT91SAM7S
47
SAM7S Series [DATASHEET]
6175M–ATARM–26-Oct-12
12. Debug and Test Features
12.1
Description
The SAM7S Series Microcontrollers feature a number of complementary debug and test capabilities. A common
JTAG/ICE (EmbeddedICE) port is used for standard debugging functions, such as downloading code and single-
stepping through programs. The Debug Unit provides a two-pin UART that can be used to upload an application
into internal SRAM. It manages the interrupt handling of the internal COMMTX and COMMRX signals that trace the
activity of the Debug Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from a PC-based test
environment.
12.2
Block Diagram
Figure 12-1. Debug and Test Block Diagram
ICE
PDC
DBGU
PIO
DRXD
DTXD
TST
TMS
TCK
TDI
JTAGSEL
TDO
Boundary
TAP
ICE/JTAG
TAP
ARM7TDMI
Reset
and
Test
POR
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