參數(shù)資料
型號: BTA2008W-600D
廠商: NXP SEMICONDUCTORS
元件分類: 晶閘管
英文描述: 3Q Hi-Com Triac
中文描述: 4 QUADRANT LOGIC LEVEL TRIAC
封裝: PLASTIC PACKAGE-4
文件頁數(shù): 3/16頁
文件大小: 490K
代理商: BTA2008W-600D
BTA2008W-600D
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 1 — 7 July 2011
3 of 16
NXP Semiconductors
BTA2008W-600D
3Q Hi-Com Triac
4.
Limiting values
Table 4.
In accordance with the Absolute Maximum Rating System (IEC 60134).
Limiting values
Symbol
V
DRM
I
T(RMS)
Parameter
repetitive peak off-state voltage
RMS on-state current
Conditions
Min
-
-
Max
600
0.8
Unit
V
A
full sine wave; T
sp
108 °C; see
Figure 3
;
see
Figure 1
; see
Figure 2
full sine wave; T
j(init)
= 25 °C; t
p
= 20 ms;
see
Figure 4
; see
Figure 5
full sine wave; T
j(init)
= 25 °C; t
p
= 16.7 ms
t
p
= 10 ms; sine-wave pulse
I
T
= 1.5 A; I
G
= 20 mA; dI
G
/dt = 0.2 A/μs
I
TSM
non-repetitive peak on-state
current
-
9
A
-
-
-
-
-
-
-40
-
9.9
0.41
100
2
5
0.1
150
125
A
A
2
s
A/μs
A
W
W
°C
°C
I
2
t
dI
T
/dt
I
GM
P
GM
P
G(AV)
T
stg
T
j
I
2
t for fusing
rate of rise of on-state current
peak gate current
peak gate power
average gate power
storage temperature
junction temperature
over any 20ms period
Fig 1.
RMS on-state current as a function of surge
duration; maximum values
Fig 2.
RMS on-state current as a function of lead
temperature; maximum values
003aag395
2
4
6
I
T(RMS)
(A)
0
10
-2
surge duration (s)
10
1
10
-1
T
sp
(°C)
-50
150
100
0
50
003aag396
0.4
0.6
0.2
0.8
1
I
T(RMS)
(A)
0
108 °C
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