參數(shù)資料
型號(hào): CD4019BDMSR
廠商: INTERSIL CORP
元件分類: 門電路
英文描述: 4000/14000/40000 SERIES, QUAD 2-INPUT AND-OR GATE, CDIP16
封裝: BRAZE SEALED, DIP-16
文件頁數(shù): 5/7頁
文件大?。?/td> 113K
代理商: CD4019BDMSR
7-311
Specications CD4019BMS
Logic Diagram
FIGURE 1. CD4019BMS LOGIC DIAGRAM
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUPS
MIL-STD-883
METHOD
TEST
READ AND RECORD
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION
OPEN
GROUND
VDD
9V
± -0.5V
OSCILLATOR
50kHz
25kHz
Static Burn-In 1
Note 1
10 -13
1 - 9, 14, 15
16
Static Burn-In 2
Note 1
10 -13
8
1 - 7, 9, 14 - 16
Dynamic Burn-
In Note 1
-
8
16
10 - 13
-
1 - 7, 9, 14, 15
Irradiation
Note 2
10 -13
8
1 - 7, 9, 14 - 16
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K
± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K
± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V
± 0.5V
TABLE 6. APPLICABLE SUBGROUPS
(Continued)
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
READ AND RECORD
13
1
15
14
9
12
11
10
2
3
4
5
6
7
*Ka
*Kb
*A4
*B4
*A3
*B3
*A2
*B2
*A1
*B1
D3
D2
D1
D4
VDD = 16
VSS - 8
VDD
VSS
*INPUTS PROTECTED
BY CMOS PROTECTION
NETWORK
TO 3 MORE
SIMILAR
CIRCUITS
TRUTH TABLE
Ka
Kb
An
Bn
Dn
101
X
1
100
X
0
01
X
1
01
X
0
00
X
0
11000
11011
11101
11111
X = Don’t Care Case
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