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DAC488HR
General Information
Support Software
The DAC488HR series is shipped with
QuickBasic
and C sample programs.
Free VIs (Virtual Instruments) are avail-
able from IOtech that enable the immedi-
ate integration of the DAC488HR series
into existing LabVIEW
applications. Each
of these ready-to-use VIs provide immedi-
ate access to common DAC488HR func-
tions, and both include source code that
can be modified to meet specific
application requirements.
Stimulus/Response System
When configured with an ADC488A se-
ries A/D converter, the DAC488HR is well-
suited for stimulus/response testing. For
synchronous operation in which acquisi-
tion must begin simultaneously with the
stimulus output, the DAC488HR’s TTL
trigger output is connected directly with
the ADC488A’s TTL trigger input; for non-
synchronous operation in which acquisi-
tion must begin at a specified time after
the stimulus output, the DAC488HR’s trig-
ger output can be “delayed” up to 65,535
update clock counts.
Multi-DAC488HR
Synchronization
Multiple DAC488HRs can be configured
in master/slave mode to synchronously
output data either from their internal
buffers, or continuously from the IEEE
488 bus. When daisy-chained together
using the CA-112 master-slave cable, the
number of DAC488HRs in a system is
limited only by the number of available
IEEE 488 addresses, and the trigger “l(fā)a-
tency” between each unit is 60 ns*. For
applications that require non-additive trig-
ger latencies, the DAC488HRs can be con-
figured in parallel, limiting total system
trigger latency to 60 ns.
Continuously output a standard
wave function under program
control
Output a series of voltage values
based on TTL triggers
Initiate a trigger delay from 1 to
65,535 update clock pulses
Synchronously output multiple
waveforms under program
control
Output a standard waveform
acquired by the ADC488A series
digitizer
Continuously output a large
arbitrary waveform from the IEEE
488 bus at up to 200 Kbytes/s
Standard function generator
outputs for general purpose
applications
Sequenced V out for controlling
power supplies or other analog
programmable instruments
Allows a device under test (DUT)
to attain a steady state prior to
measurement
Ideal for stimulus/response
applications with critical time
and phase relationships
Ideal for simulating complex
signals such as EKGs and
contact bounce
For audio system testing, speech
research, and other tests
requiring long-time waveform
generation
Waveform(s)
Functional Requirement
Typical Application
T1
T2
T3
T4
trigger event
trigger delay
Analog output signal
* A system with one master and three slave units will have a total system trigger latency of 180 ns