參數(shù)資料
型號： DAC6574EVM
廠商： Texas Instruments, Inc.
英文描述： DAC6574 Evaluation Module(DAC6574評估模塊)
中文描述： DAC6574評估模塊（DAC6574評估模塊）
文件頁數(shù)： 20/39頁
文件大?。?/td> 437K
代理商： DAC6574EVM
EVM Performance
2-6
2.2
EVM Performance
EVM performance is tested using a high-density DAC bench test board, an
Agilent 3458A digital multimeter, and a PC running National Instruments
LABVIEW software. The EVM board is tested for all codes of the device under
test (DUT) and is allowed to settle for 1 ms before the meter is read. This
process is repeated for all codes to generate the measurements for INL and
DNL.
The parameters and results of the DAC EVM characterization test for the
DAC7574 are shown in Figures 2-8 through 2-12. Test parameters and
results for the DAC8571 are shown in Figures 2-13 and 2-14.
The characterization-test data for the DAC7571, DAC6574, DAC6571,
DAC5574, and DAC5571 are not shown; it is assumed that their performance
is comparable to or better than that of the DAC7574 EVM.
Figure 2-8. DAC7574EVM Test Parameters and Results
相關(guān)PDF資料
PDF描述
DAC7574EVM DAC7574 Evaluation Module(DAC7574評估模塊)
DAC5571EVM DAC5571 Evaluation Module(DAC5571評估模塊)
DAC6571EVM DAC6571 Evaluation Module(DAC6571評估模塊)
DAC7571EVM DAC7571 Evaluation Module(DAC7571評估模塊)
DAC56 Monolithic 16-Bit Resolution DIGITAL-TO-ANALOG CONVERTER
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