ELECTRICAL CHARACTERISTICS The l denote" />
參數(shù)資料
型號： DC1786A
廠商： Linear Technology
文件頁數(shù)： 33/36頁
文件大?。?/td> 0K
描述： BOARD DEMO LTC2871
設(shè)計資源： DC1786A Design Files
DC1786A Schematic
標(biāo)準(zhǔn)包裝： 1
主要目的： 接口，收發(fā)器，RS-232/RS-485
嵌入式： 否
已用 IC / 零件： LTC2871
主要屬性： 3 個驅(qū)動器，3 個接收器
次要屬性： 3 V ~ 5.5 V 電源
已供物品： 板
相關(guān)產(chǎn)品： LTC2871CUHF#PBF-ND - IC TXRX RS485/RS422 38-QFN
LTC2871IUHF#PBF-ND - IC TXRX RS485/RS422 38-QFN
LTC2871CFE#PBF-ND - IC TXRX RS485/RS422 38-TSSOP
LTC2871IFE#PBF-ND - IC TXRX RS485/RS422 38-TSSOP
LTC2871CUHF#TRPBF-ND - IC TXRX RS485/RS422 38-QFN
LTC2871IFE#TRPBF-ND - IC TXRX RS485/RS422 38-TSSOP
LTC2871IUHF#TRPBF-ND - IC TXRX RS485/RS422 38-QFN
LTC2871CFE#TRPBF-ND - IC TXRX RS485/RS422 38-TSSOP
LTC2870/LTC2871
6
28701f
ELECTRICAL CHARACTERISTICS The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. VCC = VL = 3.3V, TE485 = 0V, LB = 0V unless otherwise noted. VL ≤ VCC.
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
RS485 AC Characteristics
Maximum Data Rate
(Note 3)
l
20
Mbps
tPLHD485
tPHLD485
Driver Propagation Delay
RDIFF = 54Ω, CL = 100pF (Figure 4)
l
20
70
ns
Driver Propagation Delay Difference
|tPLHD485 – tPHLD485|
RDIFF = 54Ω, CL = 100pF (Figure 4)
l
16
ns
tSKEWD485
Driver Skew (Y to Z)
RDIFF = 54Ω, CL = 100pF (Figure 4)
l
1±6
ns
tRD485, tFD485
Driver Rise or Fall Time
RDIFF = 54Ω, CL = 100pF (Figure 4)
l
15
ns
tZLD485, tZHD485,
tLZD485, tHZD485
Driver Output Enable or Disable Time
FEN = VL, RL = 500Ω, CL = 50pF (Figure 5)
l
120
ns
tZHSD485, tZLSD485 Driver Enable from Shutdown
RL = 500Ω, CL = 50pF (Figure 5)
l
8μs
tPLHR485, tPHLR485 Receiver Input to Output
CL = 15pF, VCM = 1.5V, |A – B| = 1.5V
(Figure 6) (Note 5)
l
65
85
ns
tSKEWR485
Differential Receiver Skew
|tPLHR485 – tPHLR485|
CL = 15pF (Figure 6)
l
16
ns
tRR485, tFR485
Receiver Output Rise or Fall Time
CL = 15pF (Figure 6)
l
315
ns
tZLR485, tZHR485,
tLZR485, tHZR485
Receiver Output Enable or Disable Time
FEN = VL, RL = 1kΩ, CL = 15pF (Figure 7)
l
50
ns
tRTEN485, tRTZ485
Termination Enable or Disable Time
FEN = VL, VB = 0V, VAB = 2V (Figure 8) (Note 5) l
100
μs
RS232 AC Characteristics
Maximum Data Rate
RL = 3kΩ, CL = 2500pF
RL = 3kΩ, CL = 500pF
(Note 3)
l
100
500
kbps
Driver Slew Rate (Figure 9)
RL = 3kΩ, CL = 2500pF
RL = 3kΩ, CL = 50pF
l
4
30
V/μs
tPHLD232, tPLHD232 Driver Propagation Delay
RL = 3kΩ, CL = 50pF (Figure 9)
l
12
μs
tSKEWD232
Driver Skew
RL = 3kΩ, CL = 50pF (Figure 9)
50
ns
tZLD232, tZHD232,
tLZD232, tHZD232
Driver Output Enable or Disable Time
FEN = VL, RL = 3kΩ, CL = 50pF (Figure 10)
l
0.4
2
μs
tPHLR232, tPLHR232 Receiver Propagation Delay
CL = 150pF (Figure 11)
l
60
200
ns
tSKEWR232
Receiver Skew
CL = 150pF (Figure 11)
25
ns
tRR232, tFR232
Receiver Rise or Fall Time
CL = 150pF (Figure 11)
l
60
200
ns
tZLR232, tZHR232,
tLZR232, tHZR232
Receiver Output Enable or Disable Time
FEN = VL, RL = 1kΩ, CL = 150pF (Figure 12)
l
0.7
2
μs
Power Supply Generator
VDD/VEE Supply Rise Time
FEN =
, (Notes 3 and 4)
l
0.2
2
ms
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: All currents into device pins are positive; all currents out of device
pins are negative. All voltages are referenced to device ground unless
otherwise specified.
Note 3: Guaranteed by other measured parameters and not tested directly.
Note 4: Time from FEN
until VDD ≥ 5V and VEE ≤ –5V. External
components as shown in the Typical Application section.
Note 5: Condition applies to A, B for H/F = 0V, and Y, Z for H/F = VL.
Note 6: This IC includes overtemperature protection that is intended
to protect the device during momentary overload conditions.
Overtemperature protection activates at a junction temperature exceeding
150°C. Continuous operation above the specified maximum operating
junction temperature may result in device degradation or failure.
Note 7: Guaranteed by design and not subject to production test.
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