參數(shù)資料
型號(hào): DS1859B-050+T&R/B
廠商: Maxim Integrated Products
文件頁(yè)數(shù): 26/28頁(yè)
文件大?。?/td> 0K
描述: IC RES DUAL TEMP-CTRL 16-CSBGA
產(chǎn)品培訓(xùn)模塊: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
標(biāo)準(zhǔn)包裝: 2,500
接片: 256
電阻(歐姆): 50k
電路數(shù): 2
溫度系數(shù): 標(biāo)準(zhǔn)值 50 ppm/°C
存儲(chǔ)器類型: 非易失
接口: I²C(設(shè)備位址)
電源電壓: 2.85 V ~ 5.5 V
工作溫度: -40°C ~ 95°C
安裝類型: 表面貼裝
封裝/外殼: 16-LBGA,CSPBGA
供應(yīng)商設(shè)備封裝: 16-CSBGA(4x4)
包裝: 帶卷 (TR)
DS1859
Dual, Temperature-Controlled Resistors with
Internally Calibrated Monitors
_______________________________________________________________________________________
7
Typical Operating Characteristics (continued)
(VCC = 5.0V, TA = +25°C, for both 50k
and 20k versions, unless otherwise noted.)
POSITION FFh RESISTANCE
vs. TEMPERATURE
DS1859
toc14
TEMPERATURE (
°C)
RESISTANCE
(k
)
80
65
50
35
20
5
-10
-25
51.20
51.40
51.60
51.80
52.00
51.00
-40
95
50k
VERSION
POSITION FFh RESISTANCE
vs. TEMPERATURE
DS1859
toc15
TEMPERATURE (
°C)
RESISTANCE
(k
)
80
65
50
35
20
5
-10
-25
19.20
19.40
19.50
19.80
20.00
19.00
-40
95
20k
VERSION
TEMPERATURE COEFFICIENT vs. SETTING
DS1859
toc16
SETTING (DEC)
TEMPERATURE
COEFFICIENT
(ppm/
°C)
200
150
100
50
100
50
0
-50
150
200
250
300
350
400
-100
0
250
50k
VERSION
+25
°C TO +95°C
+25
°C TO -40°C
TEMPERATURE COEFFICIENT vs. SETTING
DS1859
toc17
SETTING (DEC)
TEMPERATURE
COEFFICIENT
(ppm/
°C)
200
150
100
50
100
0
200
300
400
500
600
700
800
-100
0
250
+25
°C TO +95°C
+25
°C TO -40°C
20k
VERSION
LSB ERROR vs. FULL-SCALE INPUT
DS1859
toc18
NORMALIZED FULL SCALE (%)
LSB
ERROR
75
50
25
-7
-6
-5
-4
-3
-2
-1
0
1
2
3
4
5
6
-8
0
100
+3 SIGMA
-3 SIGMA
MEAN
LSB ERROR vs. FULL-SCALE INPUT
DS1859
toc19
NORMALIZED FULL SCALE (%)
LSB
ERROR
9.375
6.250
3.125
-3
-2
-1
0
1
2
3
-4
0
12.500
+3 SIGMA
-3 SIGMA
MEAN
POSITION 00h RESISTANCE
vs. TEMPERATURE
DS1859
toc13
TEMPERATURE (
°C)
RESISTANCE
(k
)
80
65
50
35
20
5
-10
-25
0.34
0.35
0.36
0.37
0.38
0.33
-40
95
20k
VERSION
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DS1859E-020/R 制造商:MAXIM 制造商全稱:Maxim Integrated Products 功能描述:Dual, Temperature-Controlled Resistors with Internally Calibrated Monitors