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參數(shù)資料
| 型號(hào)： | DS3134 |
| 廠商： | DALLAS SEMICONDUCTOR |
| 元件分類： | Digital Transmission Controller |
| 英文描述： | DATACOM, FRAMER, PBGA256 |
| 封裝： | 27 X 27 MM, PLASTIC, BGA-256 |
| 文件頁(yè)數(shù)： | 92/203頁(yè) |
| 文件大小： | 777K |
| 代理商： | DS3134 |
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DS3134
181 of 203
Capture-DR
Data may be parallel loaded into the Test Data registers selected by the current instruction.
If the
instruction does not call for a parallel load or the selected register does not allow parallel loads, the Test
register will remain at its current value. On the rising edge of JTCLK, the controller will go to the
Shift-DR state if JTMS is low or it will go to the Exit1-DR state if JTMS is high.
Shift-DR
The Test Data register selected by the current instruction will be connected between JTDI and JTDO and
will shift data one stage towards its serial output on each rising edge of JTCLK. If a Test register selected
by the current instruction is not placed in the serial path, it will maintain its previous state.
Exit1-DR
While in this state, a rising edge on JTCLK with JTMS high will put the controller in the Update-DR
state, which terminates the scanning process. A rising edge on JTCLK with JTMS low will put the
controller in the Pause-DR state.
Pause-DR
Shifting of the Test registers is halted while in this state. All Test registers selected by the current
instruction will retain their previous state. The controller will remain in this state while JTMS is low. A
rising edge on JTCLK with JTMS high will put the controller in the Exit2-DR state.
Exit2-DR
While in this state, a rising edge on JTCLK with JTMS high will put the controller in the Update-DR state
and terminate the scanning process. A rising edge on JTCLK with JTMS low will enter the Shift-DR
state.
Update-DR
A falling edge on JTCLK while in the Update-DR state will latch the data from the shift register path of
the Test registers into the data output latches. This prevents changes at the parallel output due to changes
in the shift register. A rising edge on JTCLK with JTMS low, will put the controller in the Run-Test-Idle
state. With JTMS high, the controller will enter the Select-DR-Scan state.
Select-IR-Scan
All Test registers retain their previous state. The Instruction register will remain unchanged during this
state. With JTMS low, a rising edge on JTCLK moves the controller into the Capture-IR state and will
initiate a scan sequence for the Instruction register. JTMS high during a rising edge on JTCLK puts the
controller back into the Test-Logic-Reset state.
Capture-IR
The Capture-IR state is used to load the shift register in the Instruction register with a fixed value. This
value is loaded on the rising edge of JTCLK. If JTMS is high on the rising edge of JTCLK, the controller
will enter the Exit1-IR state. If JTMS is low on the rising edge of JTCLK, the controller will enter the
Shift-IR state.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
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| DS-313PIN | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Analog Miscellaneous |
| DS-313-PIN | 功能描述:信號(hào)調(diào)節(jié) RoHS:否 制造商:EPCOS 產(chǎn)品:Duplexers 頻率:782 MHz, 751 MHz 頻率范圍: 電壓額定值: 帶寬: 阻抗:50 Ohms 端接類型:SMD/SMT 封裝 / 箱體:2.5 mm x 2 mm 工作溫度范圍:- 30 C to + 85 C 封裝:Reel |
| DS31400 | 制造商:MAXIM 制造商全稱:Maxim Integrated Products 功能描述:8-Input, 14-Output, Dual DPLL Timing IC with Sub-ps Output Jitter |
| DS31400DK | 功能描述:時(shí)鐘和定時(shí)器開發(fā)工具 DS31400 Dev Kit RoHS:否 制造商:Texas Instruments 產(chǎn)品:Evaluation Modules 類型:Clock Conditioners 工具用于評(píng)估:LMK04100B 頻率:122.8 MHz 工作電源電壓:3.3 V |
| DS31400GN | 功能描述:計(jì)時(shí)器和支持產(chǎn)品 Not Available From Mouser RoHS:否 制造商:Micrel 類型:Standard 封裝 / 箱體:SOT-23 內(nèi)部定時(shí)器數(shù)量:1 電源電壓-最大:18 V 電源電壓-最小:2.7 V 最大功率耗散: 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝:Reel |
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