參數(shù)資料
型號(hào)： EPM3064ATI44-10
廠商： Altera
文件頁(yè)數(shù)： 9/46頁(yè)
文件大?。?/td> 0K
描述： IC MAX 3000A CPLD 64 44-TQFP
產(chǎn)品變化通告： Bond Wire Change 4/Sept/2008
標(biāo)準(zhǔn)包裝： 480
系列： MAX® 3000A
可編程類(lèi)型： 系統(tǒng)內(nèi)可編程
最大延遲時(shí)間 tpd(1)： 10.0ns
電壓電源 - 內(nèi)部： 3 V ~ 3.6 V
邏輯元件/邏輯塊數(shù)目： 4
宏單元數(shù)： 64
門(mén)數(shù)： 1250
輸入/輸出數(shù)： 34
工作溫度： -40°C ~ 85°C
安裝類(lèi)型： 表面貼裝
封裝/外殼： 44-TQFP
供應(yīng)商設(shè)備封裝： 44-TQFP（10x10）
包裝： 托盤(pán)
產(chǎn)品目錄頁(yè)面： 603 (CN2011-ZH PDF)
其它名稱(chēng)： 544-1162
Altera Corporation
17
MAX 3000A Programmable Logic Device Family Data Sheet
Programming
with External
Hardware
MAX 3000A devices can be programmed on Windows–based PCs with an
Altera Logic Programmer card, MPU, and the appropriate device adapter.
The MPU performs continuity checking to ensure adequate electrical
contact between the adapter and the device.
f For more information, see the Altera Programming Hardware Data Sheet.
The Altera software can use text– or waveform–format test vectors created
with the Altera Text Editor or Waveform Editor to test the programmed
device. For added design verification, designers can perform functional
testing to compare the functional device behavior with the results of
simulation.
Data I/O, BP Microsystems, and other programming hardware
manufacturers also provide programming support for Altera devices.
f For more information, see Programming Hardware Manufacturers.
IEEE Std.
1149.1 (JTAG)
Boundary–Scan
Support
MAX 3000A devices include the JTAG BST circuitry defined by IEEE
Std. 1149.1–1990. Table 7 describes the JTAG instructions supported by
MAX 3000A devices. The pin-out tables found on the Altera web site
(http://www.altera.com) or the Altera Digital Library show the location of
the JTAG control pins for each device. If the JTAG interface is not
required, the JTAG pins are available as user I/O pins.
Table 7. MAX 3000A JTAG Instructions
JTAG Instruction
Description
SAMPLE/PRELOAD
Allows a snapshot of signals at the device pins to be captured and examined during
normal device operation, and permits an initial data pattern output at the device pins
EXTEST
Allows the external circuitry and board–level interconnections to be tested by forcing a
test pattern at the output pins and capturing test results at the input pins
BYPASS
Places the 1–bit bypass register between the TDI and TDO pins, which allows the BST
data to pass synchronously through a selected device to adjacent devices during normal
device operation
IDCODE
Selects the IDCODE register and places it between the TDI and TDO pins, allowing the
IDCODE to be serially shifted out of TDO
USERCODE
Selects the 32–bit USERCODE register and places it between the TDI and TDO pins,
allowing the USERCODE value to be shifted out of TDO
ISP Instructions
These instructions are used when programming MAX 3000A devices via the JTAG ports
with the MasterBlaster, ByteBlasterMV, or BitBlaster cable, or when using a Jam STAPL
file, JBC file, or SVF file via an embedded processor or test equipment
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