參數(shù)資料
型號(hào)： EPM7064STI44-7N
廠商： Altera
文件頁(yè)數(shù)： 18/66頁(yè)
文件大?。?/td> 0K
描述： IC MAX 7000 CPLD 64 44-TQFP
標(biāo)準(zhǔn)包裝： 160
系列： MAX® 7000
可編程類型： 系統(tǒng)內(nèi)可編程
最大延遲時(shí)間 tpd(1)： 7.5ns
電壓電源 - 內(nèi)部： 4.5 V ~ 5.5 V
邏輯元件/邏輯塊數(shù)目： 4
宏單元數(shù)： 64
門數(shù)： 1250
輸入/輸出數(shù)： 36
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 44-TQFP
供應(yīng)商設(shè)備封裝： 44-TQFP（10x10）
包裝： 托盤
產(chǎn)品目錄頁(yè)面： 603 (CN2011-ZH PDF)
其它名稱： 544-2024
EPM7064STI44-7N-ND
Altera Corporation
25
MAX 7000 Programmable Logic Device Family Data Sheet
Design Security
All MAX 7000 devices contain a programmable security bit that controls
access to the data programmed into the device. When this bit is
programmed, a proprietary design implemented in the device cannot be
copied or retrieved. This feature provides a high level of design security
because programmed data within EEPROM cells is invisible. The security
bit that controls this function, as well as all other programmed data, is
reset only when the device is reprogrammed.
Generic Testing
Each MAX 7000 device is functionally tested. Complete testing of each
programmable EEPROM bit and all internal logic elements ensures 100%
programming yield. AC test measurements are taken under conditions
equivalent to those shown in Figure 10. Test patterns can be used and then
erased during early stages of the production flow.
Figure 10. MAX 7000 AC Test Conditions
QFP Carrier &
Development
Socket
MAX 7000 and MAX 7000E devices in QFP packages with 100 or more
pins are shipped in special plastic carriers to protect the QFP leads. The
carrier is used with a prototype development socket and special
programming hardware available from Altera. This carrier technology
makes it possible to program, test, erase, and reprogram a device without
exposing the leads to mechanical stress.
f For detailed information and carrier dimensions, refer to the QFP Carrier
1
MAX 7000S devices are not shipped in carriers.
VCC
To Test
System
C1 (includes JIG
capacitance)
Device input
rise and fall
times < 3 ns
Device
Output
464
Ω
[703
Ω]
250
[8.06
]
Ω
K
Ω
Power supply transients can affect AC
measurements. Simultaneous
transitions of multiple outputs should be
avoided for accurate measurement.
Threshold tests must not be performed
under AC conditions. Large-amplitude,
fast ground-current transients normally
occur as the device outputs discharge
the load capacitances. When these
transients flow through the parasitic
inductance between the device ground
pin and the test system ground,
significant reductions in observable
noise immunity can result. Numbers in
brackets are for 2.5-V devices and
outputs. Numbers without brackets are
for 3.3-V devices and outputs.
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