
AMERICAN MICROSYSTEMS, INC.
November 2000
ISO9001
QS9000
4
FS612509-01/-02
1:9 Zero-Delay Clock Buffer IC
5.0 Electrical Specifications
Table 3: Absolute Maximum Ratings
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These conditions represent a stress rating only, and functional operation of the device at
these or any other conditions above the operational limits noted in this specification is not implied. Exposure to maximum rating conditions for extended conditions may affect device performance,
functionality, and reliability.
PARAMETER
SYMBOL
MIN.
MAX.
UNITS
Supply Voltage, dc, Clock Buffers (V
SS
= ground)
Supply Voltage, dc, Core
AV
DD
V
DD
V
I
V
O
I
IK
I
OK
T
S
T
A
T
J
V
SS
- 0.5
V
SS
- 0.5
V
SS
- 0.5
V
SS
- 0.5
-50
7
V
7
V
Input Voltage, dc
V
DD
+ 0.5
V
DD
+ 0.5
50
V
Output Voltage, dc
V
Input Clamp Current, dc (V
I
< 0 or V
I
> V
DD
)
Output Clamp Current, dc (V
I
< 0 or V
I
> V
DD
)
Storage Temperature Range (non-condensing)
mA
-50
50
mA
-65
150
°C
Ambient Temperature Range, Under Bias
Junction Temperature
Lead Temperature (soldering, 10s)
Static Discharge Voltage Protection (MIL-STD 883E, Method 3015.7)
-55
125
125
260
2
°C
°C
°C
kV
CAUTION: ELECTROSTATIC SENSITIVE DEVICE
Permanent damage resulting in a loss of functionality or performance may occur if this device is subjected to a high-energy
electrostatic discharge.
Table 4: Operating Conditions
PARAMETER
SYMBOL
CONDITIONS/DESCRIPTION
MIN.
TYP.
MAX.
UNITS
Supply Voltage, Core and Outputs
Ambient Operating Temperature Range
Output Load Capacitance
Input Frequency
Input Duty Cycle
Input Rise/Fall Time
V
DD
T
A
C
L
f
CLK
3.3V ± 10%
3.0
0
3.3
3.6
70
15
140
60
3
V
°C
pF
MHz
%
ns
CLK
CLK
CLK
50
40