參數(shù)資料
型號(hào): FSYC9055D3
廠商: INTERSIL CORP
元件分類: JFETs
英文描述: Radiation Hardened, SEGR Resistant P-Channel Power MOSFETs
中文描述: 59 A, 60 V, 0.027 ohm, P-CHANNEL, Si, POWER, MOSFET
封裝: CERAMIC, LCC-3
文件頁(yè)數(shù): 1/8頁(yè)
文件大小: 51K
代理商: FSYC9055D3
1
July 1999
FSYC9055D, FSYC9055R
Radiation Hardened, SEGR Resistant
P-Channel Power MOSFETs
Features
59A, -60V, r
DS(ON)
= 0.027
Total Dose
- Meets Pre-RAD Specifications to 100K RAD (Si)
Single Event
- Safe Operating Area Curve for Single Event Effects
- SEE Immunity for LET of 36MeV/mg/cm
2
with
V
DS
up to 80% of Rated Breakdown and
V
GS
of 10V Off-Bias
Dose Rate
- Typically Survives 3E9 RAD (Si)/s at 80% BV
DSS
- Typically Survives 2E12 if Current Limited to I
DM
Photo Current
- 6nA Per-RAD(Si)/s Typically
Neutron
- Maintain Pre-RAD Specifications
for 3E13 Neutrons/cm
2
- Usable to 3E14Neutrons/cm
2
g
Formerly available as type TA17750.
Description
The Discrete Products Operation of Harris Semiconductor
has developed a series of Radiation Hardened MOSFETs
specifically designed for commercial and military space
applications. Enhanced Power MOSFET immunity to Single
Event Effects (SEE), Single Event Gate Rupture (SEGR) in
particular, is combined with 100K RADS of total dose hard-
ness to provide devices which are ideally suited to harsh
space environments. The dose rate and neutron tolerance
necessary for military applications have not been sacrificed.
The Harris portfolio of SEGR resistant radiation hardened
MOSFETs includes N-Channel and P-Channel devices in a
variety of voltage, current and on-resistance ratings. Numer-
ous packaging options are also available.
This MOSFET is an enhancement-mode silicon-gate power
field-effect transistor of the vertical DMOS (VDMOS) struc-
ture. It is specially designed and processed to be radiation
tolerant. The MOSFET is well suited for applications
exposed to radiation environments such as switching regula-
tion, switching converters, motor drives, relay drivers and
drivers for high-power bipolar switching transistors requiring
high speed and low gate drive power. This type can be
operated directly from integrated circuits.
Reliability screening is available as either commercial, TXV
equivalent
of
MIL-S-19500,
MIL-S-19500.
Contact
Harris
desired deviations from the data sheet.
or
Space
Semiconductor
equivalent
of
for
any
Symbol
Package
SMD-2
Ordering Information
RAD LEVEL
SCREENING LEVEL
PART NUMBER/BRAND
10K
Commercial
FSYC9055D1
10K
TXV
FSYC9055D3
100K
Commercial
FSYC9055R1
100K
TXV
FSYC9055R3
100K
Space
FSYC9055R4
G
D
S
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
Harris Corporation 1999
File Number
4525.1
[ /Title
(FSYC
9055D,
FSYC
9055R)
/Sub-
ject
(Radia-
tion
Hard-
ened,
SEGR
Resis-
tant
P-
Chan-
nel
Power
MOS-
FETs)
/Autho
r ()
/Key-
words
(Radia-
tion
Hard-
ened,
SEGR
Resis-
tant P-
Chan-
nel
Power
MOS-
FETs)
/Cre-
ator ()
/DOCI
POSSOBSOLETE PRODUCT
FSTYC9055D, FSTYC9055R
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